3.3.3. Contributed Definitions

A description of each NeXus contributed definition is given. NXDL files in the NeXus contributed definitions include propositions from the community for NeXus base classes or application definitions, as well as other NXDL files for long-term archival by NeXus. Consider the contributed definitions as either in incubation or a special case not for general use. The NIAC: The NeXus International Advisory Committee is charged to review any new contributed definitions and provide feedback to the authors before ratification and acceptance as either a base class or application definition.

NXaberration

Models for aberrations of electro-magnetic lenses in electron microscopy.

NXaperture_em

Details of an individual aperture for electron beams.

NXapm

Application definition for atom probe microscopy experiments.

NXcalibration

Subclass of NXprocess to describe post-processing calibrations.

NXchamber

Component of an instrument to store or place objects and specimens.

NXcollectioncolumn

Subclass of NXelectronanalyser to describe the electron collection column of a

NXcontainer

State of a container holding the sample under investigation.

NXcoordinate_system_set

Container to hold different coordinate systems conventions.

NXcorrector_cs

Corrector for aberrations in an electron microscope.

NXcsg

Constructive Solid Geometry base class, using NXquadric and NXoff_geometry

NXcxi_ptycho

Application definition for a ptychography experiment, compatible with CXI from version 1.6.

NXdeflector

Deflectors as they are used e.g. in an electron analyser.

NXdistortion

Subclass of NXprocess to describe post-processing distortion correction.

NXebeam_column

Container for components to form a controlled electron beam.

NXelectronanalyser

Subclass of NXinstrument to describe a photoelectron analyser.

NXelectrostatic_kicker

definition for a electrostatic kicker.

NXellipsometry

Ellipsometry, complex systems, up to variable angle spectroscopy.

NXem

Characterization and session with one sample in an electron microscope.

NXenergydispersion

Subclass of NXelectronanalyser to describe the energy dispersion section of a

NXevent_data_em

Metadata and settings of an electron microscope for scans and images.

NXevent_data_em_set

Container to hold NXevent_data_em instances of an electron microscope session.

NXibeam_column

Container for components of a focused-ion-beam (FIB) system.

NXimage_set_em_adf

Container for reporting a set of annular dark field images.

NXimage_set_em_bf

Container for reporting a set of images taken in bright field mode.

NXimage_set_em_bse

Container for reporting a set of back-scattered electron images.

NXimage_set_em_chamber

Container for images recorded with e.g. a TV camera in the microscope chamber.

NXimage_set_em_df

Container for reporting a set of images taken in dark field mode.

NXimage_set_em_diffrac

Container for reporting a set of diffraction images.

NXimage_set_em_ecci

Container for reporting back-scattered electron channeling contrast images.

NXimage_set_em_kikuchi

Electron backscatter diffraction (EBSD) Kikuchi pattern.

NXimage_set_em_ronchigram

Container for reporting a set of images related to a ronchigram.

NXimage_set_em_se

Container for reporting a set of secondary electron images.

NXinteraction_vol_em

Base class for storing details about a modelled shape of interaction volume.

NXion

Set of atoms of a molecular ion or fragment in e.g. ToF mass spectrometry.

NXlens_em

Description of an electro-magnetic lens or a compound lens.

NXmagnetic_kicker

definition for a magnetic kicker.

NXmanipulator

Extension of NXpositioner to include fields to describe the use of manipulators

NXmanufacturer

Details about a component as defined by its manufacturer.

NXmpes

This is the most general application definition for multidimensional

NXoptical_system_em

A container for qualifying an electron optical system.

NXpeak

Description of peaks, their functional form or measured support.

NXpulser_apm

Metadata for laser-, voltage-, or combined pulsing triggering field evaporation.

NXpump

Device to reduce an atmosphere to a controlled remaining pressure level.

NXquadric

definition of a quadric surface.

NXquadrupole_magnet

definition for a quadrupole magnet.

NXreflectron

Device for reducing flight time differences of ions in ToF experiments.

NXregion

Geometry and logical description of a region of data in a parent group. When used, it could be a child group to, say, NXdetector.

NXregistration

Describes image registration procedures.

NXscanbox_em

Scan box and coils which deflect an electron beam in a controlled manner.

NXseparator

definition for an electrostatic separator.

NXsnsevent

This is a definition for event data from Spallation Neutron Source (SNS) at ORNL.

NXsnshisto

This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL.

NXsolenoid_magnet

definition for a solenoid magnet.

NXsolid_geometry

the head node for constructively defined geometry

NXspectrum_set_em_auger

Container for reporting a set of auger electron energy spectra.

NXspectrum_set_em_cathodolum

Container for reporting a set of cathodoluminescence spectra.

NXspectrum_set_em_eels

Container for reporting a set of electron energy loss spectra.

NXspectrum_set_em_xray

Container for reporting a set of energy-dispersive X-ray spectra.

NXspin_rotator

definition for a spin rotator.

NXspindispersion

Subclass of NXelectronanalyser to describe the spin filters in photoemission

NXstage_lab

A stage lab can be used to hold, align, orient, and prepare a specimen.

NXxpcs

X-ray Photon Correlation Spectroscopy (XPCS) data (results).