3.3.3. Contributed DefinitionsΒΆ
A description of each NeXus contributed definition is given. NXDL files in the NeXus contributed definitions include propositions from the community for NeXus base classes or application definitions, as well as other NXDL files for long-term archival by NeXus. Consider the contributed definitions as either in incubation or a special case not for general use. The NIAC: The NeXus International Advisory Committee is charged to review any new contributed definitions and provide feedback to the authors before ratification and acceptance as either a base class or application definition.
- Some contributions are grouped together:
and others are simply listed here:
- NXaberration
Quantified aberration coefficient in an aberration_model.
- NXaberration_model
Models for aberrations of electro-magnetic lenses in electron microscopy.
- NXaberration_model_ceos
CEOS definitions/model for aberrations of electro-magnetic lenses.
- NXaberration_model_nion
NION definitions/model for aberrations of electro-magnetic lenses.
- NXadc
Analog-to-digital converter component/integrated circuit.
- NXaperture_em
Details of an individual aperture for beams in electron microscopy.
- NXbeam_path
A beam path consisting of one or more optical elements.
- NXbeam_splitter
A beam splitter, i.e. a device splitting the light into two or more beams.
- NXcalibration
Subclass of NXprocess to describe post-processing calibrations.
- NXchamber
Component of an instrument to store or place objects and specimens.
- NXchemical_composition
(Chemical) composition of a sample or a set of things.
- NXcircuit_board
Circuit board with e.g. ADC and/or DAC electronic components.
- NXclustering
Metadata to the results of a clustering analysis.
- NXcollectioncolumn
Subclass of NXelectronanalyser to describe the electron collection column of a
- NXcontainer
State of a container holding the sample under investigation.
- NXcoordinate_system_set
Container to hold different coordinate systems conventions.
- NXcorrector_cs
Corrector for aberrations in an electron microscope.
- NXcs_computer
Computer science description of a set of computing nodes.
- NXcs_cpu
Computer science description of a central processing unit (CPU) of a computer.
- NXcs_filter_boolean_mask
Computer science base class for packing and unpacking booleans.
- NXcs_gpu
Computer science description of a graphic processing unit (GPU) of a computer.
- NXcs_io_obj
Computer science description of a storage object in an input/output system.
- NXcs_io_sys
Computer science description of system of a computer.
- NXcs_mm_sys
Computer science description of a main memory system of a computer.
- NXcs_prng
Computer science description of pseudo-random number generator.
- NXcs_profiling
Computer science description for summary performance/profiling data of an application.
- NXcs_profiling_event
Computer science description of a profiling event.
- NXcsg
Constructive Solid Geometry base class, using NXquadric and NXoff_geometry
- NXcxi_ptycho
Application definition for a ptychography experiment, compatible with CXI from version 1.6.
- NXdac
Digital-to-analog converter component/integrated circuit.
- NXdeflector
Deflectors as they are used e.g. in an electron analyser.
- NXdelocalization
Base class to describe the delocalization of point-like objects on a grid.
- NXdispersion
A dispersion denoting a sum of different dispersions.
- NXdispersion_function
This describes a dispersion function for a material or layer
- NXdispersion_repeated_parameter
A repeated parameter for a dispersion function
- NXdispersion_single_parameter
A single parameter for a dispersion function
- NXdispersion_table
A dispersion table denoting energy, dielectric function tabulated values.
- NXdispersive_material
NXdispersion
- NXdistortion
Subclass of NXprocess to describe post-processing distortion correction.
- NXebeam_column
Container for components to form a controlled beam in electron microscopy.
- NXelectronanalyser
Subclass of NXinstrument to describe a photoelectron analyser.
- NXelectrostatic_kicker
definition for a electrostatic kicker.
- NXellipsometry
Ellipsometry, complex systems, up to variable angle spectroscopy.
- NXem
Characterization of a sample during a session on an electron microscope.
- NXem_ebsd
Application definition for collecting and indexing Kikuchi pattern into orientation maps.
- NXem_ebsd_conventions
Conventions for rotations and coordinate systems to interpret EBSD data.
- NXem_ebsd_crystal_structure_model
Crystal structure phase models used for indexing Kikuchi pattern.
- NXenergydispersion
Subclass of NXelectronanalyser to describe the energy dispersion section of a
- NXevent_data_em
Metadata and settings of an electron microscope for scans and images.
- NXevent_data_em_set
Container to hold NXevent_data_em instances of an electron microscope session.
- NXfabrication
Details about a component as defined by its manufacturer.
- NXfiber
An optical fiber, e.g. glass fiber.
- NXgraph_edge_set
A set of (eventually directed) edges which connect nodes/vertices of a graph.
- NXgraph_node_set
A set of nodes/vertices in space representing members of a graph.
- NXgraph_root
An instance of a graph.
- NXibeam_column
Container for components of a focused-ion-beam (FIB) system.
- NXimage_set
Container for reporting a set of images taken.
- NXimage_set_em_adf
Container for reporting a set of annular dark field images.
- NXimage_set_em_kikuchi
Measured set of electron backscatter diffraction data, aka Kikuchi pattern.
- NXinteraction_vol_em
Base class for storing details about a modelled shape of interaction volume.
- NXion
Set of atoms of a molecular ion or fragment in e.g. ToF mass spectrometry.
- NXisocontour
Computational geometry description of isocontouring/phase-fields in Euclidean space.
- NXiv_temp
Application definition for temperature-dependent IV curve measurements.
- NXlab_electro_chemo_mechanical_preparation
Grinding and polishing of a sample using abrasives in a wet lab.
- NXlab_sample_mounting
Embedding of a sample in a medium for easing processability.
- NXlens_em
Description of an electro-magnetic lens or a compound lens.
- NXlens_opt
Description of an optical lens.
- NXmagnetic_kicker
definition for a magnetic kicker.
- NXmanipulator
Extension of NXpositioner to include fields to describe the use of manipulators
- NXmatch_filter
Settings of a filter to select or remove entries based on their value.
- NXmpes
This is the most general application definition for multidimensional
- NXopt
An application definition for optical spectroscopy experiments.
- NXoptical_system_em
A container for qualifying an electron optical system.
- NXorientation_set
Details about individual orientations of a set of objects.
- NXpeak
Description of peaks, their functional form or measured support.
- NXpid
Contains the settings of a PID controller.
- NXpolarizer_opt
An optical polarizer.
- NXprogram
Base class to describe a software tool or library.
- NXpulser_apm
Metadata for laser- and/or voltage-pulsing in atom probe microscopy.
- NXpump
Device to reduce an atmosphere to a controlled remaining pressure level.
- NXquadric
definition of a quadric surface.
- NXquadrupole_magnet
definition for a quadrupole magnet.
- NXreflectron
Device for reducing flight time differences of ions in ToF experiments.
- NXregion
Geometry and logical description of a region of data in a parent group. When used, it could be a child group to, say, NXdetector.
- NXregistration
Describes image registration procedures.
- NXscanbox_em
Scan box and coils which deflect an electron beam in a controlled manner.
- NXsensor_scan
Application definition for a generic scan using sensors.
- NXseparator
definition for an electrostatic separator.
- NXsimilarity_grouping
Metadata to the results of a similarity grouping analysis.
- NXslip_system_set
Base class for describing a set of crystallographic slip systems.
- NXsnsevent
This is a definition for event data from Spallation Neutron Source (SNS) at ORNL.
- NXsnshisto
This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL.
- NXsolenoid_magnet
definition for a solenoid magnet.
- NXsolid_geometry
the head node for constructively defined geometry
- NXspatial_filter
Spatial filter to filter entries within a region-of-interest based on their
- NXspectrum_set
Container for reporting a set of spectra.
- NXspectrum_set_em_eels
Container for reporting a set of electron energy loss (EELS) spectra.
- NXspectrum_set_em_xray
Container for reporting a set of energy-dispersive X-ray spectra.
- NXspin_rotator
definition for a spin rotator.
- NXspindispersion
Subclass of NXelectronanalyser to describe the spin filters in photoemission
- NXstage_lab
A stage lab can be used to hold, align, orient, and prepare a specimen.
- NXstress
Application definition for stress and strain analysis of crystalline material defined by the EASI-STRESS consortium.
- NXsubsampling_filter
Settings of a filter to sample entries based on their value.
- NXtransmission
Application definition for transmission experiments
- NXwaveplate
A waveplate or retarder.
- NXxpcs
X-ray Photon Correlation Spectroscopy (XPCS) data (results).