NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

This content is also available in these formats: json txt yml

@active_transformation: /NXdata@active_transformation-attribute
@auxiliary_signals: /NXdata@auxiliary_signals-attribute
@axes: /NXcxi_ptycho/DATA@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute; /NXdata/DATA@axes-attribute; /NXdata@axes-attribute; /NXdetector/efficiency@axes-attribute; /NXellipsometry/ENTRY/plot@axes-attribute; /NXguide/reflectivity@axes-attribute
@axis: /NXdata/AXISNAME@axis-attribute; /NXdetector/time_of_flight@axis-attribute; /NXdetector/x_pixel_offset@axis-attribute; /NXdetector/y_pixel_offset@axis-attribute; /NXdetector/z_pixel_offset@axis-attribute
@axisname_indices: /NXdata@AXISNAME_indices-attribute
@baseline_reference: /NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute; /NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class: /NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/DATA@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute; /NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute; /NXcanSAS/ENTRY@canSAS_class-attribute
@check_sum: /NXdetector/data@check_sum-attribute
@comment: /NXentry/revision@comment-attribute; /NXsubentry/revision@comment-attribute
@configuration: /NXentry/program_name@configuration-attribute; /NXsubentry/program_name@configuration-attribute
@creator: /NXroot@creator-attribute
@creator_version: /NXroot@creator_version-attribute
@default: /NXaperture@default-attribute; /NXattenuator@default-attribute; /NXbeam@default-attribute; /NXbeam_stop@default-attribute; /NXbending_magnet@default-attribute; /NXcanSAS/ENTRY@default-attribute; /NXcapillary@default-attribute; /NXcite@default-attribute; /NXcollimator@default-attribute; /NXcrystal@default-attribute; /NXcylindrical_geometry@default-attribute; /NXdetector@default-attribute; /NXdetector_group@default-attribute; /NXdetector_module@default-attribute; /NXdisk_chopper@default-attribute; /NXentry@default-attribute; /NXevent_data@default-attribute; /NXfermi_chopper@default-attribute; /NXfilter@default-attribute; /NXflipper@default-attribute; /NXfresnel_zone_plate@default-attribute; /NXgeometry@default-attribute; /NXgrating@default-attribute; /NXguide@default-attribute; /NXinsertion_device@default-attribute; /NXinstrument@default-attribute; /NXlog@default-attribute; /NXmirror@default-attribute; /NXmoderator@default-attribute; /NXmonitor@default-attribute; /NXmonochromator@default-attribute; /NXnote@default-attribute; /NXoff_geometry@default-attribute; /NXorientation@default-attribute; /NXparameters@default-attribute; /NXpinhole@default-attribute; /NXpolarizer@default-attribute; /NXpositioner@default-attribute; /NXprocess@default-attribute; /NXreflections@default-attribute; /NXroot@default-attribute; /NXsample@default-attribute; /NXsample_component@default-attribute; /NXsensor@default-attribute; /NXshape@default-attribute; /NXslit@default-attribute; /NXsource@default-attribute; /NXsubentry@default-attribute; /NXtransformations@default-attribute; /NXtranslation@default-attribute; /NXuser@default-attribute; /NXvelocity_selector@default-attribute; /NXxraylens@default-attribute
@depends_on: /NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute; /NXdetector_module/fast_pixel_direction@depends_on-attribute; /NXdetector_module/module_offset@depends_on-attribute; /NXdetector_module/slow_pixel_direction@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute; /NXtransformations/AXISNAME@depends_on-attribute
@description: /NXelectrostatic_kicker/timing@description-attribute; /NXmagnetic_kicker/timing@description-attribute; /NXreflections/background_mean@description-attribute; /NXreflections/bounding_box@description-attribute; /NXreflections/d@description-attribute; /NXreflections/det_module@description-attribute; /NXreflections/entering@description-attribute; /NXreflections/flags@description-attribute; /NXreflections/h@description-attribute; /NXreflections/id@description-attribute; /NXreflections/int_prf@description-attribute; /NXreflections/int_prf_errors@description-attribute; /NXreflections/int_prf_var@description-attribute; /NXreflections/int_sum@description-attribute; /NXreflections/int_sum_errors@description-attribute; /NXreflections/int_sum_var@description-attribute; /NXreflections/k@description-attribute; /NXreflections/l@description-attribute; /NXreflections/lp@description-attribute; /NXreflections/observed_frame@description-attribute; /NXreflections/observed_frame_errors@description-attribute; /NXreflections/observed_frame_var@description-attribute; /NXreflections/observed_phi@description-attribute; /NXreflections/observed_phi_errors@description-attribute; /NXreflections/observed_phi_var@description-attribute; /NXreflections/observed_px_x@description-attribute; /NXreflections/observed_px_x_errors@description-attribute; /NXreflections/observed_px_x_var@description-attribute; /NXreflections/observed_px_y@description-attribute; /NXreflections/observed_px_y_errors@description-attribute; /NXreflections/observed_px_y_var@description-attribute; /NXreflections/observed_x@description-attribute; /NXreflections/observed_x_errors@description-attribute; /NXreflections/observed_x_var@description-attribute; /NXreflections/observed_y@description-attribute; /NXreflections/observed_y_errors@description-attribute; /NXreflections/observed_y_var@description-attribute; /NXreflections/overlaps@description-attribute; /NXreflections/partiality@description-attribute; /NXreflections/polar_angle@description-attribute; /NXreflections/predicted_frame@description-attribute; /NXreflections/predicted_phi@description-attribute; /NXreflections/predicted_px_x@description-attribute; /NXreflections/predicted_px_y@description-attribute; /NXreflections/predicted_x@description-attribute; /NXreflections/predicted_y@description-attribute; /NXreflections/prf_cc@description-attribute; /NXreflections/reflection_id@description-attribute; /NXreflections@description-attribute
@direction: /NXsample/electric_field@direction-attribute; /NXsample/magnetic_field@direction-attribute; /NXsample/stress_field@direction-attribute
@distribution: /NXdata/AXISNAME@distribution-attribute
@entry: /NXarpes/ENTRY@entry-attribute; /NXiqproc/ENTRY@entry-attribute; /NXsastof/ENTRY@entry-attribute; /NXsqom/ENTRY@entry-attribute; /NXxas/ENTRY@entry-attribute; /NXxasproc/ENTRY@entry-attribute
@equipment_component: /NXtransformations/AXISNAME@equipment_component-attribute
@file_name: /NXroot@file_name-attribute
@file_time: /NXroot@file_time-attribute
@file_update_time: /NXroot@file_update_time-attribute
@first_good: /NXdata/AXISNAME@first_good-attribute
@first_point_for_fit: /NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux: /NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency: /NXdetector/raw_time_of_flight@frequency-attribute
@h5py_version: /NXroot@h5py_version-attribute
@hdf5_version: /NXroot@HDF5_Version-attribute
@hdf_version: /NXroot@HDF_version-attribute
@i_axes: /NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version: /NXentry@IDF_Version-attribute; /NXsubentry@IDF_Version-attribute
@index: /NXarchive/entry@index-attribute
@interpretation: /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good: /NXdata/AXISNAME@last_good-attribute
@local_name: /NXdetector/crate@local_name-attribute; /NXdetector/input@local_name-attribute; /NXdetector/slot@local_name-attribute
@long_name: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@long_name-attribute; /NXdata/AXISNAME@long_name-attribute; /NXdata/DATA@long_name-attribute; /NXdetector/data@long_name-attribute; /NXdetector/time_of_flight@long_name-attribute; /NXdetector/x_pixel_offset@long_name-attribute; /NXdetector/y_pixel_offset@long_name-attribute; /NXdetector/z_pixel_offset@long_name-attribute; /NXimage_set_em_adf/DATA/image_id@long_name-attribute; /NXimage_set_em_adf/DATA/xpos@long_name-attribute; /NXimage_set_em_adf/DATA/ypos@long_name-attribute; /NXimage_set_em_adf/DATA@long_name-attribute; /NXimage_set_em_kikuchi/DATA/image_id@long_name-attribute; /NXimage_set_em_kikuchi/DATA/intensity@long_name-attribute; /NXimage_set_em_kikuchi/DATA/xpos@long_name-attribute; /NXimage_set_em_kikuchi/DATA/ypos@long_name-attribute; /NXimage_set_em_se/DATA/image_id@long_name-attribute; /NXimage_set_em_se/DATA/intensity@long_name-attribute; /NXimage_set_em_se/DATA/xpos@long_name-attribute; /NXimage_set_em_se/DATA/ypos@long_name-attribute; /NXspectrum_set_em_xray/DATA/photon_energy@long_name-attribute; /NXspectrum_set_em_xray/DATA/xpos@long_name-attribute; /NXspectrum_set_em_xray/DATA/ypos@long_name-attribute; /NXspectrum_set_em_xray/DATA@long_name-attribute; /NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos@long_name-attribute; /NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos@long_name-attribute; /NXspectrum_set_em_xray/indexing/composition_map/DATA@long_name-attribute
@mask: /NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices: /NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@mime_type: /NXsubentry/thumbnail@mime_type-attribute
@name: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute; /NXcanSAS/ENTRY/run@name-attribute
@nexus_version: /NXroot@NeXus_version-attribute
@nx_class: /NXroot@NX_class-attribute
@offset: /NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute; /NXdetector_module/fast_pixel_direction@offset-attribute; /NXdetector_module/module_offset@offset-attribute; /NXdetector_module/slow_pixel_direction@offset-attribute; /NXevent_data/event_time_zero@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute; /NXtomoproc/entry/data/data@offset-attribute; /NXtransformations/AXISNAME@offset-attribute
@offset_units: /NXdetector_module/fast_pixel_direction@offset_units-attribute; /NXdetector_module/module_offset@offset_units-attribute; /NXdetector_module/slow_pixel_direction@offset_units-attribute; /NXtransformations/AXISNAME@offset_units-attribute
@populated_elements: /NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
@primary: /NXdetector/time_of_flight@primary-attribute; /NXdetector/x_pixel_offset@primary-attribute; /NXdetector/y_pixel_offset@primary-attribute; /NXdetector/z_pixel_offset@primary-attribute
@q_indices: /NXcanSAS/ENTRY/DATA@Q_indices-attribute
@region_type: /NXregion@region_type-attribute
@resolutions: /NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
@resolutions_description: /NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
@scaling: /NXtomoproc/entry/data/data@scaling-attribute
@scaling_factor: /NXcanSAS/ENTRY/DATA/I@scaling_factor-attribute; /NXlog/cue_timestamp_zero@scaling_factor-attribute; /NXlog/time@scaling_factor-attribute
@short_name: /NXelectronanalyser/name@short_name-attribute; /NXinstrument/name@short_name-attribute; /NXmx/ENTRY/INSTRUMENT/name@short_name-attribute; /NXmx/ENTRY/SOURCE/name@short_name-attribute; /NXsource/name@short_name-attribute
@signal: /NXcanSAS/ENTRY/DATA@signal-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@signal-attribute; /NXcxi_ptycho/DATA@signal-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@signal-attribute; /NXdata/DATA@signal-attribute; /NXdata@signal-attribute; /NXdetector/efficiency@signal-attribute; /NXguide/reflectivity@signal-attribute; /NXlauetof/entry/instrument/detector/data@signal-attribute; /NXmpes/ENTRY/DATA@signal-attribute; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA@signal-attribute; /NXsas/ENTRY/DATA@signal-attribute; /NXxbase/entry/instrument/detector/data@signal-attribute
@start: /NXdetector/start_time@start-attribute; /NXdetector/stop_time@start-attribute; /NXdisk_chopper/top_dead_center@start-attribute; /NXevent_data/cue_timestamp_zero@start-attribute; /NXlog/cue_timestamp_zero@start-attribute; /NXlog/time@start-attribute
@storage_mode: /NXxpcs/entry/data/G2_unnormalized@storage_mode-attribute; /NXxpcs/entry/data/delay_difference@storage_mode-attribute; /NXxpcs/entry/data/g2@storage_mode-attribute; /NXxpcs/entry/data/g2_derr@storage_mode-attribute; /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute; /NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
@surface_indices: /NXguide/reflectivity@surface_indices-attribute
@t_axes: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
@time: /NXattenuator/status@time-attribute; /NXsource/last_fill@time-attribute
@time_origin_location: /NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
@timestamp: /NXcanSAS/ENTRY/DATA@timestamp-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
@transform: /NXtomoproc/entry/data/data@transform-attribute
@transformation_type: /NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute; /NXdata/TRANSFORMATION@transformation_type-attribute; /NXdetector_module/fast_pixel_direction@transformation_type-attribute; /NXdetector_module/module_offset@transformation_type-attribute; /NXdetector_module/slow_pixel_direction@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute; /NXtransformations/AXISNAME@transformation_type-attribute
@type: /NXapm/ENTRY/thumbnail@type-attribute; /NXem/ENTRY/thumbnail@type-attribute; /NXentry/thumbnail@type-attribute
@uncertainties: /NXcanSAS/ENTRY/DATA/I@uncertainties-attribute; /NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
@units: /NXcanSAS/ENTRY/DATA/I@units-attribute; /NXcanSAS/ENTRY/DATA/Idev@units-attribute; /NXcanSAS/ENTRY/DATA/Q@units-attribute; /NXcanSAS/ENTRY/DATA/Qdev@units-attribute; /NXcanSAS/ENTRY/DATA/Qmean@units-attribute; /NXcanSAS/ENTRY/DATA/dQl@units-attribute; /NXcanSAS/ENTRY/DATA/dQw@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute; /NXdata/AXISNAME@units-attribute; /NXparameters/term@units-attribute
@url: /NXellipsometry/ENTRY/INSTRUMENT/firmware@url-attribute; /NXellipsometry/ENTRY/acquisition_program@url-attribute; /NXellipsometry/ENTRY/definition@url-attribute; /NXentry/definition@URL-attribute; /NXentry/definition_local@URL-attribute; /NXsubentry/definition@URL-attribute; /NXsubentry/definition_local@URL-attribute
@varied_variable: /NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
@vector: /NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute; /NXcxi_ptycho/sample_1/transformations@vector-attribute; /NXdetector_module/fast_pixel_direction@vector-attribute; /NXdetector_module/module_offset@vector-attribute; /NXdetector_module/slow_pixel_direction@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute; /NXtransformations/AXISNAME@vector-attribute
@version: /NXapm/ENTRY/atom_probe/hit_multiplicity/program@version-attribute; /NXapm/ENTRY/atom_probe/ion_filtering/program@version-attribute; /NXapm/ENTRY/atom_probe/ion_impact_positions/program@version-attribute; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/background_quantification/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_identification/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/program@version-attribute; /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program@version-attribute; /NXapm/ENTRY/program@version-attribute; /NXapm/ENTRY@version-attribute; /NXarchive/entry/program@version-attribute; /NXcanSAS/ENTRY@version-attribute; /NXellipsometry/ENTRY/INSTRUMENT/firmware@version-attribute; /NXellipsometry/ENTRY/INSTRUMENT/model@version-attribute; /NXellipsometry/ENTRY/definition@version-attribute; /NXem/ENTRY/program@version-attribute; /NXem/ENTRY@version-attribute; /NXentry/definition@version-attribute; /NXentry/definition_local@version-attribute; /NXentry/entry_identifier_uuid@version-attribute; /NXentry/program_name@version-attribute; /NXimage_set_em_adf/PROCESS/program@version-attribute; /NXmpes/ENTRY/definition@version-attribute; /NXmx/ENTRY@version-attribute; /NXspe/ENTRY/definition@version-attribute; /NXspectrum_set_em_xray/indexing/composition_map/program@version-attribute; /NXspectrum_set_em_xray/indexing/program@version-attribute; /NXsubentry/definition@version-attribute; /NXsubentry/definition_local@version-attribute; /NXsubentry/program_name@version-attribute
@wavelength_indices: /NXdetector/efficiency@wavelength_indices-attribute; /NXguide/reflectivity@wavelength_indices-attribute
@xml_version: /NXroot@XML_version-attribute
a: /NXcsg/a-group
aberration: /NXcorrector_cs/ABERRATION-group
absorbed_beam: /NXxas/ENTRY/DATA/absorbed_beam-link; /NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material: /NXcollimator/absorbing_material-field; /NXfermi_chopper/absorbing_material-field
absorption_cross_section: /NXattenuator/absorption_cross_section-field
ac_line_sync: /NXscanbox_em/ac_line_sync-field
acceleration_time: /NXpositioner/acceleration_time-field
accepted_photon_beam_divergence: /NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture: /NXcapillary/accepting_aperture-field
acquisition_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field; /NXdetector/acquisition_mode-field
acquisition_program: /NXellipsometry/ENTRY/acquisition_program-group
acquisition_speed: /NXimage_set_em_kikuchi/profiling/acquisition_speed-field
acquisition_time: /NXimage_set_em_kikuchi/profiling/acquisition_time-field
active: /NXimage_set_em_se/dynamic_focus/active-field; /NXimage_set_em_se/tilt_correction/active-field
address: /NXapm/ENTRY/operator/address-field; /NXellipsometry/ENTRY/operator/address-field; /NXem/ENTRY/operator/address-field; /NXuser/address-field
adf_inner_half_angle: /NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
adf_outer_half_angle: /NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
aequatorial_angle: /NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field; /NXsas/ENTRY/SAMPLE/aequatorial_angle-field; /NXsastof/ENTRY/instrument/detector/aequatorial_angle-field; /NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation: /NXapm/ENTRY/operator/affiliation-field; /NXellipsometry/ENTRY/operator/affiliation-field; /NXem/ENTRY/operator/affiliation-field; /NXuser/affiliation-field
alpha: /NXxkappa/entry/sample/alpha-field
alternative: /NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS/alternative-field
amplifier_type: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
analyser: /NXarpes/ENTRY/INSTRUMENT/analyser-group; /NXindirecttof/entry/INSTRUMENT/analyser-group; /NXtas/entry/INSTRUMENT/analyser-group
analysis_chamber: /NXapm/ENTRY/atom_probe/analysis_chamber-group; /NXapm/ENTRY/atom_probe/control_software/analysis_chamber-group
angle_of_incidence: /NXellipsometry/ENTRY/INSTRUMENT/angle_of_incidence-field
angles: /NXarpes/ENTRY/INSTRUMENT/analyser/angles-field; /NXgrating/angles-field
angular_calibration: /NXdetector/angular_calibration-field; /NXmpes/ENTRY/PROCESS/angular_calibration-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied: /NXdetector/angular_calibration_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/angular_dispersion-field
angular_resolution: /NXelectronanalyser/angular_resolution-field
angular_spread: /NXellipsometry/ENTRY/INSTRUMENT/angular_spread-field
aperture: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group; /NXcollectioncolumn/APERTURE-group; /NXenergydispersion/APERTURE-group; /NXinstrument/APERTURE-group; /NXsnsevent/ENTRY/instrument/APERTURE-group; /NXsnshisto/ENTRY/instrument/APERTURE-group; /NXxraylens/aperture-field
aperture_em: /NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM-group; /NXebeam_column/APERTURE_EM-group; /NXibeam_column/APERTURE_EM-group
applied: /NXapm/ENTRY/atom_probe/REFLECTRON/applied-field; /NXcalibration/applied-field; /NXcorrector_cs/applied-field; /NXdistortion/applied-field; /NXmpes/ENTRY/PROCESS/angular_calibration/applied-field; /NXmpes/ENTRY/PROCESS/energy_calibration/applied-field; /NXmpes/ENTRY/PROCESS/momentum_calibration/applied-field; /NXmpes/ENTRY/PROCESS/spatial_calibration/applied-field; /NXregistration/applied-field
arrival_time_pairs: /NXapm/ENTRY/atom_probe/ion_impact_positions/arrival_time_pairs-field
atom_probe: /NXapm/ENTRY/atom_probe-group
atom_types: /NXapm/ENTRY/specimen/atom_types-field; /NXellipsometry/ENTRY/SAMPLE/atom_types-field; /NXem/ENTRY/SAMPLE/atom_types-field
attached_to: /NXsensor/attached_to-field
attenuator: /NXinstrument/ATTENUATOR-group; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group; /NXsnsevent/ENTRY/instrument/ATTENUATOR-group; /NXsnshisto/ENTRY/instrument/ATTENUATOR-group; /NXxrot/entry/instrument/attenuator-group
attenuator_transmission: /NXattenuator/attenuator_transmission-field; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field; /NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author: /NXnote/author-field; /NXsnsevent/ENTRY/SNSHistoTool/author-field; /NXsnshisto/ENTRY/SNSHistoTool/author-field
average_value: /NXlog/average_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error: /NXlog/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors: /NXlog/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axisname: /NXdata/AXISNAME-field; /NXtransformations/AXISNAME-field
axisname_end: /NXtransformations/AXISNAME_end-field
axisname_increment_set: /NXtransformations/AXISNAME_increment_set-field
azimuthal: /NXspe/ENTRY/data/azimuthal-field
azimuthal_angle: /NXcrystal/azimuthal_angle-field; /NXdetector/azimuthal_angle-field; /NXlauetof/entry/instrument/detector/azimuthal_angle-field; /NXreflections/azimuthal_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field; /NXsastof/ENTRY/instrument/detector/azimuthal_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field; /NXtofraw/entry/instrument/detector/azimuthal_angle-field; /NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_width: /NXspe/ENTRY/data/azimuthal_width-field
b: /NXcsg/b-group
background_correction: /NXimage_set_em_kikuchi/oim/background_correction-group
background_mean: /NXreflections/background_mean-field
background_quantification: /NXapm/ENTRY/atom_probe/ranging/background_quantification-group
band_contrast: /NXimage_set_em_kikuchi/oim/band_detection/band_contrast-field
band_detection: /NXimage_set_em_kikuchi/oim/band_detection-group
band_slope: /NXimage_set_em_kikuchi/oim/band_detection/band_slope-field
bands: /NXimage_set_em_kikuchi/oim/band_detection/bands-field
bandwidth: /NXinsertion_device/bandwidth-field
base_temperature: /NXapm/ENTRY/atom_probe/STAGE_LAB/base_temperature-field
beam: /NXcontainer/beam-group; /NXebeam_column/BEAM-group; /NXibeam_column/BEAM-group; /NXinstrument/BEAM-group; /NXmpes/ENTRY/INSTRUMENT/BEAM-group; /NXmx/ENTRY/INSTRUMENT/BEAM-group; /NXsample/BEAM-group
beam_1: /NXcxi_ptycho/entry_1/instrument_1/beam_1-group
beam_center_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field; /NXdetector/beam_center_x-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsastof/ENTRY/instrument/detector/beam_center_x-field; /NXxpcs/entry/instrument/DETECTOR/beam_center_x-field; /NXxrot/entry/instrument/detector/beam_center_x-field
beam_center_y: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field; /NXdetector/beam_center_y-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsastof/ENTRY/instrument/detector/beam_center_y-field; /NXxpcs/entry/instrument/DETECTOR/beam_center_y-field; /NXxrot/entry/instrument/detector/beam_center_y-field
beam_position: /NXdisk_chopper/beam_position-field
beam_shape: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_stop: /NXinstrument/BEAM_STOP-group
beamline: /NXsnsevent/ENTRY/instrument/beamline-field; /NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance: /NXelectrostatic_kicker/beamline_distance-field; /NXmagnetic_kicker/beamline_distance-field; /NXquadrupole_magnet/beamline_distance-field; /NXseparator/beamline_distance-field; /NXsolenoid_magnet/beamline_distance-field; /NXspin_rotator/beamline_distance-field
bend_angle_x: /NXguide/bend_angle_x-field; /NXmirror/bend_angle_x-field
bend_angle_y: /NXguide/bend_angle_y-field; /NXmirror/bend_angle_y-field
bending_magnet: /NXinstrument/BENDING_MAGNET-group
bending_radius: /NXbending_magnet/bending_radius-field
bias_voltage: /NXimage_set_em_se/bias_voltage-field; /NXstage_lab/bias_voltage-field
bibtex: /NXcite/bibtex-field
bin_ends: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/bin_ends-field
binning: /NXimage_set_em_kikuchi/binning-group; /NXimage_set_em_kikuchi/binning/binning-field
bit_depth_readout: /NXdetector/bit_depth_readout-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
blade_geometry: /NXaperture/BLADE_GEOMETRY-group
blade_spacing: /NXcollimator/blade_spacing-field
blade_thickness: /NXcollimator/blade_thickness-field
block: /NXregion/block-field
bounding_box: /NXreflections/bounding_box-field
bragg_angle: /NXcrystal/bragg_angle-field
bright_field: /NXtomophase/entry/instrument/bright_field-group
brightness: /NXibeam_column/ion_gun/brightness-field
broadening: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/broadening-field
buffer_chamber: /NXapm/ENTRY/atom_probe/buffer_chamber-group
bunch_distance: /NXsource/bunch_distance-field
bunch_length: /NXsource/bunch_length-field
bunch_pattern: /NXsource/bunch_pattern-group
c_1_0: /NXaberration/c_1_0-field
c_1_2_a: /NXaberration/c_1_2_a-field
c_1_2_b: /NXaberration/c_1_2_b-field
c_2_1_a: /NXaberration/c_2_1_a-field
c_2_1_b: /NXaberration/c_2_1_b-field
c_2_3_a: /NXaberration/c_2_3_a-field
c_2_3_b: /NXaberration/c_2_3_b-field
c_3_0: /NXaberration/c_3_0-field
c_3_2_a: /NXaberration/c_3_2_a-field
c_3_2_b: /NXaberration/c_3_2_b-field
c_3_4_a: /NXaberration/c_3_4_a-field
c_3_4_b: /NXaberration/c_3_4_b-field
c_5_0: /NXaberration/c_5_0-field
calibrated_axis: /NXcalibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS/angular_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field
calibrated_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/calibrated_tof-field
calibration: /NXellipsometry/ENTRY/INSTRUMENT/calibration-group; /NXimage_set_em_kikuchi/calibration-group
calibration_angle_of_incidence: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_angle_of_incidence-field
calibration_data: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data-group; /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data-field
calibration_data_type: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_data_type-field
calibration_date: /NXdetector/calibration_date-field
calibration_method: /NXdetector/calibration_method-group
calibration_sample: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_sample-field
calibration_status: /NXellipsometry/ENTRY/INSTRUMENT/calibration_status-field
calibration_style: /NXscanbox_em/calibration_style-field
calibration_time: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_time-field
calibration_wavelength: /NXellipsometry/ENTRY/INSTRUMENT/calibration/calibration_data/calibration_wavelength-field
camera_length: /NXoptical_system_em/camera_length-field
capability: /NXmanufacturer/capability-field
capillary: /NXinstrument/CAPILLARY-group
cdeform_field: /NXdistortion/cdeform_field-field
center: /NXscanbox_em/center-field
center_energy: /NXenergydispersion/center_energy-field
central_stop_diameter: /NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material: /NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness: /NXfresnel_zone_plate/central_stop_thickness-field
changer_position: /NXsample/changer_position-field; /NXsnsevent/ENTRY/sample/changer_position-field; /NXsnshisto/ENTRY/sample/changer_position-field
charge_state: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field; /NXion/charge_state-field
chemical_formula: /NXarchive/entry/sample/chemical_formula-field; /NXcontainer/chemical_formula-field; /NXcrystal/chemical_formula-field; /NXfilter/chemical_formula-field; /NXmpes/ENTRY/SAMPLE/chemical_formula-field; /NXsample/chemical_formula-field; /NXsample_component/chemical_formula-field
chi: /NXxeuler/entry/name/chi-link; /NXxeuler/entry/sample/chi-field
chopper: /NXreftof/entry/instrument/chopper-group
coating_material: /NXfilter/coating_material-field; /NXgrating/coating_material-field; /NXguide/coating_material-field; /NXmirror/coating_material-field
coating_roughness: /NXfilter/coating_roughness-field; /NXgrating/coating_roughness-field; /NXguide/coating_roughness-field; /NXmirror/coating_roughness-field
coefficients: /NXcalibration/coefficients-field
collection: /NXcanSAS/ENTRY/COLLECTION-group; /NXcanSAS/ENTRY/PROCESS/COLLECTION-group; /NXdetector/COLLECTION-group; /NXentry/COLLECTION-group; /NXinstrument/COLLECTION-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group; /NXpeak/COLLECTION-group; /NXsubentry/COLLECTION-group
collection_description: /NXarchive/entry/collection_description-field; /NXentry/collection_description-field; /NXsubentry/collection_description-field
collection_identifier: /NXarchive/entry/collection_identifier-field; /NXentry/collection_identifier-field; /NXsnsevent/ENTRY/collection_identifier-field; /NXsnshisto/ENTRY/collection_identifier-field; /NXsubentry/collection_identifier-field
collection_time: /NXarchive/entry/collection_time-field; /NXentry/collection_time-field; /NXsubentry/collection_time-field
collection_title: /NXsnsevent/ENTRY/collection_title-field; /NXsnshisto/ENTRY/collection_title-field
collectioncolumn: /NXelectronanalyser/COLLECTIONCOLUMN-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
collimator: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXinstrument/COLLIMATOR-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXsastof/ENTRY/instrument/collimator-group
column_names: /NXellipsometry/ENTRY/SAMPLE/column_names-field
command1: /NXsnsevent/ENTRY/SNSHistoTool/command1-field; /NXsnshisto/ENTRY/SNSHistoTool/command1-field
comp_current: /NXflipper/comp_current-field
comp_turns: /NXflipper/comp_turns-field
company: /NXellipsometry/ENTRY/INSTRUMENT/company-field
component: /NXsample/component-field
component_index: /NXgeometry/component_index-field
composition: /NXpolarizer/composition-field
composition_map: /NXspectrum_set_em_xray/indexing/composition_map-group
concentration: /NXsample/concentration-field
confidence_index: /NXimage_set_em_kikuchi/oim/indexing/confidence_index-field
construction_year: /NXellipsometry/ENTRY/INSTRUMENT/construction_year-field
contrast_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
control: /NXlauetof/entry/control-group; /NXrefscan/entry/control-group; /NXreftof/entry/control-group; /NXsastof/ENTRY/control-group; /NXstxm/ENTRY/control-group; /NXtomo/entry/control-group; /NXtomophase/entry/control-group; /NXxbase/entry/control-group
control_software: /NXapm/ENTRY/atom_probe/control_software-group
controller_record: /NXpositioner/controller_record-field
coordinate_system_set: /NXapm/ENTRY/COORDINATE_SYSTEM_SET-group; /NXem/ENTRY/COORDINATE_SYSTEM_SET-group
corrector_cs: /NXebeam_column/CORRECTOR_CS-group
count: /NXregion/count-field
count_time: /NXdetector/count_time-field; /NXmonitor/count_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field; /NXxpcs/entry/instrument/DETECTOR/count_time-field
countrate_correction_applied: /NXdetector/countrate_correction_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
countrate_correction_lookup_table: /NXdetector/countrate_correction_lookup_table-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_lookup_table-field
counts: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/counts-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/counts-field; /NXspectrum_set_em_xray/DATA/counts-field; /NXspectrum_set_em_xray/indexing/composition_map/DATA/counts-field
coupled: /NXmoderator/coupled-field
coupling_material: /NXmoderator/coupling_material-field; /NXsnsevent/ENTRY/instrument/moderator/coupling_material-field; /NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
crate: /NXdetector/crate-field
critical_energy: /NXbending_magnet/critical_energy-field
cryocoolant: /NXmanipulator/cryocoolant-field
cryostat_temperature: /NXmanipulator/cryostat_temperature-field
crystal: /NXinstrument/CRYSTAL-group; /NXmonochromator/CRYSTAL-group; /NXmonopd/entry/INSTRUMENT/CRYSTAL-group; /NXsnsevent/ENTRY/instrument/CRYSTAL-group; /NXsnshisto/ENTRY/instrument/CRYSTAL-group
csg: /NXsolid_geometry/CSG-group
cue_index: /NXevent_data/cue_index-field; /NXlog/cue_index-field
cue_timestamp_zero: /NXevent_data/cue_timestamp_zero-field; /NXlog/cue_timestamp_zero-field
current: /NXdeflector/current-field; /NXibeam_column/ion_gun/current-field; /NXlens_em/current-field; /NXsource/current-field
curvature: /NXxraylens/curvature-field
curvature_horizontal: /NXcrystal/curvature_horizontal-field
curvature_vertical: /NXcrystal/curvature_vertical-field
cut_angle: /NXcrystal/cut_angle-field
cylinder_orientation: /NXxraylens/cylinder_orientation-group
cylinders: /NXcylindrical_geometry/cylinders-field
cylindrical: /NXxraylens/cylindrical-field
cylindrical_geometry: /NXbeam_stop/CYLINDRICAL_GEOMETRY-group
cylindrical_orientation_angle: /NXcrystal/cylindrical_orientation_angle-field
d: /NXreflections/d-field
d_spacing: /NXcrystal/d_spacing-field
dark_field: /NXtomophase/entry/instrument/dark_field-group
daslogs: /NXsnsevent/ENTRY/DASlogs-group; /NXsnshisto/ENTRY/DASlogs-group
data: /NXapm/ENTRY/DATA-group; /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA-group; /NXarpes/ENTRY/DATA-group; /NXarpes/ENTRY/INSTRUMENT/analyser/data-field; /NXbeam/DATA-group; /NXcanSAS/ENTRY/DATA-group; /NXcxi_ptycho/DATA-group; /NXcxi_ptycho/DATA/data-link; /NXcxi_ptycho/data_1/data-link; /NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field; /NXdata/DATA-field; /NXdetector/data-field; /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/data-field; /NXem/ENTRY/DATA-group; /NXentry/DATA-group; /NXfluo/entry/INSTRUMENT/fluorescence/data-field; /NXfluo/entry/MONITOR/data-field; /NXfluo/entry/data-group; /NXfluo/entry/data/data-link; /NXguide/reflectivity/data-field; /NXimage_set_em_adf/DATA-group; /NXimage_set_em_bf/DATA-group; /NXimage_set_em_bse/DATA-group; /NXimage_set_em_chamber/DATA-group; /NXimage_set_em_df/DATA-group; /NXimage_set_em_diffrac/DATA-group; /NXimage_set_em_ecci/DATA-group; /NXimage_set_em_kikuchi/DATA-group; /NXimage_set_em_ronchigram/DATA-group; /NXimage_set_em_se/DATA-group; /NXinteraction_vol_em/DATA-group; /NXiqproc/ENTRY/DATA-group; /NXiqproc/ENTRY/DATA/data-field; /NXlauetof/entry/control/data-field; /NXlauetof/entry/instrument/detector/data-field; /NXlauetof/entry/name/data-link; /NXmonitor/data-field; /NXmonopd/entry/DATA-group; /NXmonopd/entry/DATA/data-link; /NXmonopd/entry/INSTRUMENT/DETECTOR/data-field; /NXmpes/ENTRY/DATA-group; /NXmpes/ENTRY/DATA/data-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA-group; /NXmx/ENTRY/DATA-group; /NXmx/ENTRY/DATA/data-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXnote/data-field; /NXrefscan/entry/control/data-field; /NXrefscan/entry/data-group; /NXrefscan/entry/data/data-link; /NXrefscan/entry/instrument/DETECTOR/data-field; /NXreftof/entry/control/data-field; /NXreftof/entry/data-group; /NXreftof/entry/data/data-link; /NXreftof/entry/instrument/detector/data-field; /NXsas/ENTRY/DATA-group; /NXsas/ENTRY/DATA/data-link; /NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXsastof/ENTRY/control/data-field; /NXsastof/ENTRY/data-group; /NXsastof/ENTRY/data/data-link; /NXsastof/ENTRY/instrument/detector/data-field; /NXscan/ENTRY/DATA-group; /NXscan/ENTRY/DATA/data-link; /NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXscan/ENTRY/MONITOR/data-field; /NXsnsevent/ENTRY/DATA-group; /NXsnsevent/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/DATA-group; /NXsnshisto/ENTRY/DATA/data-link; /NXsnshisto/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/instrument/DETECTOR/data-field; /NXspe/ENTRY/data-group; /NXspe/ENTRY/data/data-field; /NXspectrum_set_em_auger/DATA-group; /NXspectrum_set_em_cathodolum/DATA-group; /NXspectrum_set_em_eels/DATA-group; /NXspectrum_set_em_xray/DATA-group; /NXspectrum_set_em_xray/indexing/composition_map/DATA-group; /NXsqom/ENTRY/DATA-group; /NXsqom/ENTRY/DATA/data-field; /NXstxm/ENTRY/DATA-group; /NXstxm/ENTRY/DATA/data-field; /NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_x/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_y/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_z/data-field; /NXstxm/ENTRY/control/data-field; /NXsubentry/DATA-group; /NXtas/entry/DATA-group; /NXtas/entry/DATA/data-link; /NXtas/entry/INSTRUMENT/DETECTOR/data-field; /NXtas/entry/MONITOR/data-field; /NXtofnpd/entry/INSTRUMENT/detector/data-field; /NXtofnpd/entry/MONITOR/data-field; /NXtofnpd/entry/data-group; /NXtofnpd/entry/data/data-link; /NXtofraw/entry/MONITOR/data-field; /NXtofraw/entry/data-group; /NXtofraw/entry/data/data-link; /NXtofraw/entry/instrument/detector/data-field; /NXtofsingle/entry/INSTRUMENT/detector/data-field; /NXtofsingle/entry/MONITOR/data-field; /NXtofsingle/entry/data-group; /NXtofsingle/entry/data/data-link; /NXtomo/entry/control/data-field; /NXtomo/entry/data-group; /NXtomo/entry/data/data-link; /NXtomo/entry/instrument/detector/data-field; /NXtomophase/entry/data-group; /NXtomophase/entry/data/data-link; /NXtomophase/entry/instrument/bright_field/data-field; /NXtomophase/entry/instrument/dark_field/data-field; /NXtomophase/entry/instrument/sample/data-field; /NXtomoproc/entry/data-group; /NXtomoproc/entry/data/data-field; /NXxas/ENTRY/DATA-group; /NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field; /NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field; /NXxas/ENTRY/MONITOR/data-field; /NXxasproc/ENTRY/DATA-group; /NXxasproc/ENTRY/DATA/data-field; /NXxbase/entry/DATA-group; /NXxbase/entry/DATA/data-link; /NXxbase/entry/instrument/detector/data-field; /NXxlaue/entry/instrument/source/distribution/data-field; /NXxpcs/entry/data-group
data_1: /NXcxi_ptycho/data_1-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
data_correction: /NXellipsometry/ENTRY/INSTRUMENT/data_correction-field
data_error: /NXellipsometry/ENTRY/SAMPLE/data_error-field
data_errors: /NXdetector/data_errors-field
data_file: /NXdetector/data_file-group
data_identifier: /NXellipsometry/ENTRY/SAMPLE/data_identifier-field
data_origin: /NXdetector_module/data_origin-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
data_size: /NXdetector_module/data_size-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
data_stride: /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
data_type: /NXellipsometry/ENTRY/SAMPLE/data_type-field
data_x_time_of_flight: /NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
data_x_y: /NXsnsevent/ENTRY/DATA/data_x_y-link; /NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field; /NXsnshisto/ENTRY/DATA/data_x_y-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
data_y_time_of_flight: /NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
date: /NXcanSAS/ENTRY/PROCESS/date-field; /NXnote/date-field; /NXprocess/date-field; /NXsnsevent/ENTRY/SNSHistoTool/date-field; /NXsnshisto/ENTRY/SNSHistoTool/date-field; /NXtomoproc/entry/reconstruction/date-field; /NXxasproc/ENTRY/XAS_data_reduction/date-field
dead_time: /NXdetector/dead_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
definition: /NXapm/ENTRY/definition-field; /NXarchive/entry/definition-field; /NXarpes/ENTRY/definition-field; /NXcanSAS/ENTRY/definition-field; /NXcxi_ptycho/entry_1/definition-field; /NXdirecttof/entry/definition-field; /NXellipsometry/ENTRY/definition-field; /NXem/ENTRY/definition-field; /NXentry/definition-field; /NXfluo/entry/definition-field; /NXindirecttof/entry/definition-field; /NXiqproc/ENTRY/definition-field; /NXlauetof/entry/definition-field; /NXmonopd/entry/definition-field; /NXmpes/ENTRY/definition-field; /NXmx/ENTRY/definition-field; /NXrefscan/entry/definition-field; /NXreftof/entry/definition-field; /NXsas/ENTRY/definition-field; /NXsastof/ENTRY/definition-field; /NXscan/ENTRY/definition-field; /NXsnsevent/ENTRY/definition-field; /NXsnshisto/ENTRY/definition-field; /NXspe/ENTRY/definition-field; /NXsqom/ENTRY/definition-field; /NXstxm/ENTRY/definition-field; /NXsubentry/definition-field; /NXtas/entry/definition-field; /NXtofnpd/entry/definition-field; /NXtofraw/entry/definition-field; /NXtofsingle/entry/definition-field; /NXtomo/entry/definition-field; /NXtomophase/entry/definition-field; /NXtomoproc/entry/definition-field; /NXxas/ENTRY/definition-field; /NXxasproc/ENTRY/definition-field; /NXxbase/entry/definition-field; /NXxeuler/entry/definition-field; /NXxkappa/entry/definition-field; /NXxlaue/entry/definition-field; /NXxlaueplate/entry/definition-field; /NXxnb/entry/definition-field; /NXxpcs/entry/definition-field; /NXxrot/entry/definition-field
definition_local: /NXentry/definition_local-field; /NXsubentry/definition_local-field
deflection_angle: /NXgrating/deflection_angle-field
deflector: /NXcollectioncolumn/DEFLECTOR-group; /NXelectronanalyser/DEFLECTOR-group; /NXenergydispersion/DEFLECTOR-group; /NXspindispersion/DEFLECTOR-group
defocus: /NXoptical_system_em/defocus-field
delay: /NXdisk_chopper/delay-field
delay_difference: /NXxpcs/entry/data/delay_difference-field
density: /NXcontainer/density-field; /NXcrystal/density-field; /NXfilter/density-field; /NXsample/density-field; /NXsample_component/density-field
depends_on: /NXaperture/depends_on-field; /NXattenuator/depends_on-field; /NXbeam/depends_on-field; /NXbeam_stop/depends_on-field; /NXbending_magnet/depends_on-field; /NXcapillary/depends_on-field; /NXcollectioncolumn/depends_on-field; /NXcollimator/depends_on-field; /NXcrystal/depends_on-field; /NXdeflector/depends_on-field; /NXdetector/depends_on-field; /NXdetector_module/depends_on-field; /NXdisk_chopper/depends_on-field; /NXelectronanalyser/depends_on-field; /NXenvironment/depends_on-field; /NXfermi_chopper/depends_on-field; /NXfilter/depends_on-field; /NXflipper/depends_on-field; /NXfresnel_zone_plate/depends_on-field; /NXgrating/depends_on-field; /NXguide/depends_on-field; /NXinsertion_device/depends_on-field; /NXlens_em/depends_on-field; /NXmanipulator/depends_on-field; /NXmirror/depends_on-field; /NXmoderator/depends_on-field; /NXmonitor/depends_on-field; /NXmonochromator/depends_on-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field; /NXmx/ENTRY/SAMPLE/depends_on-field; /NXpinhole/depends_on-field; /NXpolarizer/depends_on-field; /NXpositioner/depends_on-field; /NXquadric/depends_on-field; /NXregistration/depends_on-field; /NXsample/depends_on-field; /NXsensor/depends_on-field; /NXslit/depends_on-field; /NXsource/depends_on-field; /NXspindispersion/depends_on-field; /NXvelocity_selector/depends_on-field; /NXxraylens/depends_on-field
depolarization: /NXellipsometry/ENTRY/derived_parameters/depolarization-field
depth: /NXgrating/depth-field
derived_parameters: /NXellipsometry/ENTRY/derived_parameters-group
description: /NXaperture/description-field; /NXaperture_em/description-field; /NXapm/ENTRY/specimen/description-field; /NXarchive/entry/instrument/description-field; /NXarchive/entry/sample/description-field; /NXbeam_stop/description-field; /NXcalibration/description-field; /NXcanSAS/ENTRY/PROCESS/description-field; /NXchamber/description-field; /NXcite/description-field; /NXcontainer/description-field; /NXcorrector_cs/description-field; /NXdeflector/description-field; /NXdetector/description-field; /NXdistortion/description-field; /NXebeam_column/electron_gun/description-field; /NXelectronanalyser/description-field; /NXelectrostatic_kicker/description-field; /NXellipsometry/ENTRY/INSTRUMENT/stage/description-field; /NXem/ENTRY/SAMPLE/description-field; /NXem/ENTRY/em_lab/DETECTOR/description-field; /NXenvironment/description-field; /NXfilter/description-field; /NXgeometry/description-field; /NXguide/description-field; /NXibeam_column/ion_gun/description-field; /NXlens_em/description-field; /NXlog/description-field; /NXmagnetic_kicker/description-field; /NXmanipulator/description-field; /NXmirror/description-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field; /NXnote/description-field; /NXpositioner/description-field; /NXquadrupole_magnet/description-field; /NXreflectron/description-field; /NXregistration/description-field; /NXsample/description-field; /NXsample_component/description-field; /NXseparator/description-field; /NXsnsevent/ENTRY/DASlogs/LOG/description-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field; /NXsnsevent/ENTRY/SNSHistoTool/description-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsnshisto/ENTRY/DASlogs/LOG/description-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field; /NXsnshisto/ENTRY/SNSHistoTool/description-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsolenoid_magnet/description-field; /NXspin_rotator/description-field; /NXstage_lab/description-field; /NXxpcs/entry/instrument/DETECTOR/description-field
design: /NXpump/design-field; /NXstage_lab/design-field
det_module: /NXreflections/det_module-field
details: /NXcanSAS/ENTRY/SAMPLE/details-field
detection_gas_path: /NXdetector/detection_gas_path-field
detection_rate: /NXapm/ENTRY/atom_probe/ion_impact_positions/detection_rate-field
detector: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group; /NXelectronanalyser/DETECTOR-group; /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR-group; /NXem/ENTRY/em_lab/DETECTOR-group; /NXinstrument/DETECTOR-group; /NXlauetof/entry/instrument/detector-group; /NXmonopd/entry/INSTRUMENT/DETECTOR-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR-group; /NXrefscan/entry/instrument/DETECTOR-group; /NXreftof/entry/instrument/detector-group; /NXsas/ENTRY/INSTRUMENT/DETECTOR-group; /NXsastof/ENTRY/instrument/detector-group; /NXscan/ENTRY/INSTRUMENT/DETECTOR-group; /NXsnsevent/ENTRY/instrument/DETECTOR-group; /NXsnshisto/ENTRY/instrument/DETECTOR-group; /NXstxm/ENTRY/INSTRUMENT/DETECTOR-group; /NXtas/entry/INSTRUMENT/DETECTOR-group; /NXtofnpd/entry/INSTRUMENT/detector-group; /NXtofraw/entry/instrument/detector-group; /NXtofsingle/entry/INSTRUMENT/detector-group; /NXtomo/entry/instrument/detector-group; /NXxbase/entry/instrument/detector-group; /NXxeuler/entry/instrument/detector-group; /NXxkappa/entry/instrument/detector-group; /NXxlaueplate/entry/instrument/detector-group; /NXxnb/entry/instrument/detector-group; /NXxpcs/entry/instrument/DETECTOR-group; /NXxrot/entry/instrument/detector-group
detector_1: /NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_distance: /NXimage_set_em_kikuchi/oim/detector_distance-field
detector_faces: /NXoff_geometry/detector_faces-field
detector_group: /NXinstrument/DETECTOR_GROUP-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier: /NXem/ENTRY/measurement/EVENT_DATA_EM/detector_identifier-field; /NXevent_data_em/detector_identifier-field
detector_module: /NXdetector/DETECTOR_MODULE-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number: /NXcylindrical_geometry/detector_number-field; /NXdetector/detector_number-field; /NXtofnpd/entry/INSTRUMENT/detector/detector_number-field; /NXtofnpd/entry/data/detector_number-link; /NXtofraw/entry/data/detector_number-link; /NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time: /NXdetector/detector_readout_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_type: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/detector_type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
diameter: /NXdetector/diameter-field; /NXenergydispersion/diameter-field; /NXpinhole/diameter-field; /NXxlaueplate/entry/instrument/detector/diameter-field
diffraction_order: /NXgrating/diffraction_order-field
diffractometer: /NXinstrument/DIFFRACTOMETER-group
direction: /NXbeam/TRANSFORMATIONS/DIRECTION-field; /NXshape/direction-field
disk_chopper: /NXdirecttof/entry/INSTRUMENT/disk_chopper-group; /NXinstrument/DISK_CHOPPER-group; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
distance: /NXattenuator/distance-field; /NXbeam/distance-field; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field; /NXdetector/distance-field; /NXdisk_chopper/distance-field; /NXfermi_chopper/distance-field; /NXindirecttof/entry/INSTRUMENT/analyser/distance-field; /NXlauetof/entry/instrument/detector/distance-field; /NXmoderator/distance-field; /NXmonitor/distance-field; /NXmpes/ENTRY/INSTRUMENT/BEAM/distance-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXreftof/entry/instrument/chopper/distance-field; /NXreftof/entry/instrument/detector/distance-field; /NXsample/distance-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXsastof/ENTRY/instrument/detector/distance-field; /NXsnsevent/ENTRY/MONITOR/distance-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnsevent/ENTRY/instrument/moderator/distance-field; /NXsnshisto/ENTRY/MONITOR/distance-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/moderator/distance-field; /NXsource/distance-field; /NXspe/ENTRY/data/distance-field; /NXtofnpd/entry/INSTRUMENT/detector/distance-field; /NXtofnpd/entry/MONITOR/distance-field; /NXtofraw/entry/MONITOR/distance-field; /NXtofraw/entry/instrument/detector/distance-field; /NXtofsingle/entry/INSTRUMENT/detector/distance-field; /NXtofsingle/entry/MONITOR/distance-field; /NXtomo/entry/instrument/detector/distance-field; /NXtomophase/entry/instrument/sample/distance-field; /NXxbase/entry/instrument/detector/distance-field; /NXxbase/entry/sample/distance-field; /NXxpcs/entry/instrument/DETECTOR/distance-field
distance_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector: /NXbeam_stop/distance_to_detector-field
distances: /NXtranslation/distances-field
distribution: /NXmonochromator/distribution-group; /NXsource/distribution-group; /NXxlaue/entry/instrument/source/distribution-group
divergence_x: /NXcollimator/divergence_x-field
divergence_x_minus: /NXbending_magnet/divergence_x_minus-field
divergence_x_plus: /NXbending_magnet/divergence_x_plus-field
divergence_y: /NXcollimator/divergence_y-field
divergence_y_minus: /NXbending_magnet/divergence_y_minus-field
divergence_y_plus: /NXbending_magnet/divergence_y_plus-field
doi: /NXcite/doi-field
downsampled: /NXregion/downsampled-group
dql: /NXcanSAS/ENTRY/DATA/dQl-field
dqw: /NXcanSAS/ENTRY/DATA/dQw-field
drain_current: /NXmanipulator/drain_current-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/drain_current-field
duration: /NXarchive/entry/duration-field; /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/duration-field; /NXentry/duration-field; /NXlog/duration-field; /NXsnsevent/ENTRY/DASlogs/LOG/duration-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnsevent/ENTRY/duration-field; /NXsnshisto/ENTRY/DASlogs/LOG/duration-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnshisto/ENTRY/duration-field; /NXsubentry/duration-field; /NXtofraw/entry/duration-field; /NXtofsingle/entry/duration-field
duty_cycle: /NXgrating/duty_cycle-field
dwell_time: /NXimage_set_em_se/dwell_time-field
dynamic_focus: /NXimage_set_em_se/dynamic_focus-group
dynamic_phi_list: /NXxpcs/entry/instrument/masks/dynamic_phi_list-field
dynamic_q_list: /NXxpcs/entry/instrument/masks/dynamic_q_list-field
dynamic_roi_map: /NXxpcs/entry/instrument/masks/dynamic_roi_map-field
ebeam_column: /NXem/ENTRY/em_lab/EBEAM_COLUMN-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/EBEAM_COLUMN-group; /NXevent_data_em/EBEAM_COLUMN-group
ebeam_deflector: /NXem/ENTRY/em_lab/ebeam_deflector-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/ebeam_deflector-group; /NXevent_data_em/ebeam_deflector-group
ef: /NXtas/entry/DATA/ef-link; /NXtas/entry/INSTRUMENT/analyser/ef-field
efficiency: /NXdetector/efficiency-group; /NXdetector/efficiency/efficiency-field; /NXmonitor/efficiency-field; /NXpolarizer/efficiency-field
ei: /NXtas/entry/DATA/ei-link; /NXtas/entry/INSTRUMENT/monochromator/ei-field
electric_field: /NXarchive/entry/sample/electric_field-field; /NXsample/electric_field-field
electron_gun: /NXebeam_column/electron_gun-group
electronanalyser: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
element_names: /NXspectrum_set_em_xray/indexing/element_names-field
ellipsometry_type: /NXellipsometry/ENTRY/INSTRUMENT/ellipsometry_type-field
em_lab: /NXem/ENTRY/em_lab-group
email: /NXapm/ENTRY/operator/email-field; /NXellipsometry/ENTRY/operator/email-field; /NXem/ENTRY/operator/email-field; /NXuser/email-field
emittance_x: /NXsource/emittance_x-field
emittance_y: /NXsource/emittance_y-field
emitter_material: /NXebeam_column/electron_gun/emitter_material-field
emitter_type: /NXebeam_column/electron_gun/emitter_type-field; /NXibeam_column/ion_gun/emitter_type-field
en: /NXsqom/ENTRY/DATA/en-field; /NXtas/entry/DATA/en-link; /NXtas/entry/SAMPLE/en-field
end_time: /NXapm/ENTRY/end_time-field; /NXarchive/entry/end_time-field; /NXcxi_ptycho/entry_1/end_time-field; /NXem/ENTRY/end_time-field; /NXem/ENTRY/measurement/EVENT_DATA_EM/end_time-field; /NXentry/end_time-field; /NXevent_data_em/end_time-field; /NXmonitor/end_time-field; /NXmx/ENTRY/end_time-field; /NXrefscan/entry/end_time-field; /NXreftof/entry/end_time-field; /NXsas/ENTRY/end_time-field; /NXscan/ENTRY/end_time-field; /NXsnsevent/ENTRY/end_time-field; /NXsnshisto/ENTRY/end_time-field; /NXstxm/ENTRY/end_time-field; /NXsubentry/end_time-field; /NXtomo/entry/end_time-field; /NXtomophase/entry/end_time-field; /NXxpcs/entry/end_time-field
end_time_estimated: /NXmx/ENTRY/end_time_estimated-field
endnote: /NXcite/endnote-field
energies: /NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
energy: /NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field; /NXdirecttof/entry/INSTRUMENT/disk_chopper/energy-field; /NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field; /NXfermi_chopper/energy-field; /NXfluo/entry/INSTRUMENT/fluorescence/energy-field; /NXfluo/entry/data/energy-link; /NXindirecttof/entry/INSTRUMENT/analyser/energy-field; /NXinsertion_device/energy-field; /NXmonochromator/energy-field; /NXsource/energy-field; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field; /NXspe/ENTRY/data/energy-field; /NXstxm/ENTRY/DATA/energy-field; /NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxas/ENTRY/DATA/energy-link; /NXxas/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxasproc/ENTRY/DATA/energy-field
energy_calibration: /NXmpes/ENTRY/PROCESS/energy_calibration-group
energy_error: /NXmonochromator/energy_error-field
energy_errors: /NXmonochromator/energy_errors-field
energy_interval: /NXenergydispersion/energy_interval-field
energy_resolution: /NXelectronanalyser/energy_resolution-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution-field
energy_scan_mode: /NXenergydispersion/energy_scan_mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
energy_transfer: /NXbeam/energy_transfer-field
energydispersion: /NXelectronanalyser/ENERGYDISPERSION-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
entering: /NXreflections/entering-field
entrance_slit: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
entrance_slit_setting: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
entrance_slit_shape: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
entrance_slit_size: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
entry: /NXapm/ENTRY-group; /NXarchive/entry-group; /NXarpes/ENTRY-group; /NXcanSAS/ENTRY-group; /NXdirecttof/entry-group; /NXellipsometry/ENTRY-group; /NXem/ENTRY-group; /NXfluo/entry-group; /NXindirecttof/entry-group; /NXiqproc/ENTRY-group; /NXlauetof/entry-group; /NXmonopd/entry-group; /NXmpes/ENTRY-group; /NXmx/ENTRY-group; /NXrefscan/entry-group; /NXreftof/entry-group; /NXroot/ENTRY-group; /NXsas/ENTRY-group; /NXsastof/ENTRY-group; /NXscan/ENTRY-group; /NXsnsevent/ENTRY-group; /NXsnshisto/ENTRY-group; /NXspe/ENTRY-group; /NXsqom/ENTRY-group; /NXstxm/ENTRY-group; /NXtas/entry-group; /NXtofnpd/entry-group; /NXtofraw/entry-group; /NXtofsingle/entry-group; /NXtomo/entry-group; /NXtomophase/entry-group; /NXtomoproc/entry-group; /NXxas/ENTRY-group; /NXxasproc/ENTRY-group; /NXxbase/entry-group; /NXxeuler/entry-group; /NXxkappa/entry-group; /NXxlaue/entry-group; /NXxlaueplate/entry-group; /NXxnb/entry-group; /NXxpcs/entry-group; /NXxrot/entry-group
entry_1: /NXcxi_ptycho/entry_1-group
entry_identifier: /NXarchive/entry/entry_identifier-field; /NXentry/entry_identifier-field; /NXsnsevent/ENTRY/entry_identifier-field; /NXsnshisto/ENTRY/entry_identifier-field; /NXsubentry/entry_identifier-field; /NXxpcs/entry/entry_identifier-field
entry_identifier_uuid: /NXentry/entry_identifier_uuid-field; /NXxpcs/entry/entry_identifier_uuid-field
environment_conditions: /NXellipsometry/ENTRY/SAMPLE/environment_conditions-group
error: /NXspe/ENTRY/data/error-field
errors: /NXdata/errors-field
evaporation_id_included: /NXapm/ENTRY/atom_probe/ion_filtering/evaporation_id_included-field
even_layer_density: /NXmirror/even_layer_density-field
even_layer_material: /NXmirror/even_layer_material-field
event_data: /NXinstrument/EVENT_DATA-group; /NXsnsevent/ENTRY/EVENT_DATA-group
event_data_em: /NXem/ENTRY/measurement/EVENT_DATA_EM-group; /NXevent_data_em_set/EVENT_DATA_EM-group
event_id: /NXevent_data/event_id-field
event_identifier: /NXem/ENTRY/measurement/EVENT_DATA_EM/event_identifier-field; /NXevent_data_em/event_identifier-field
event_index: /NXevent_data/event_index-field; /NXsnsevent/ENTRY/EVENT_DATA/event_index-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id: /NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight: /NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset: /NXevent_data/event_time_offset-field
event_time_zero: /NXevent_data/event_time_zero-field
event_type: /NXem/ENTRY/measurement/EVENT_DATA_EM/event_type-field; /NXevent_data_em/event_type-field
exit_slit: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment_description: /NXapm/ENTRY/experiment_description-field; /NXarchive/entry/experiment_description-field; /NXellipsometry/ENTRY/experiment_description-field; /NXem/ENTRY/experiment_description-field; /NXentry/experiment_description-field; /NXsubentry/experiment_description-field
experiment_documentation: /NXapm/ENTRY/experiment_documentation-group; /NXem/ENTRY/experiment_documentation-group; /NXentry/experiment_documentation-group; /NXsubentry/experiment_documentation-group
experiment_identifier: /NXapm/ENTRY/experiment_identifier-field; /NXarchive/entry/experiment_identifier-field; /NXellipsometry/ENTRY/experiment_identifier-field; /NXem/ENTRY/experiment_identifier-field; /NXentry/experiment_identifier-field; /NXsnsevent/ENTRY/experiment_identifier-field; /NXsnshisto/ENTRY/experiment_identifier-field; /NXsubentry/experiment_identifier-field
experiments: /NXreflections/experiments-field
extent: /NXbeam/extent-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field; /NXxpcs/entry/instrument/incident_beam/extent-field
external_adc: /NXsample/external_ADC-group
external_dac: /NXsample/external_DAC-field
external_field_brief: /NXsensor/external_field_brief-field
external_field_full: /NXsensor/external_field_full-group
external_material: /NXguide/external_material-field; /NXmirror/external_material-field
extractor_current: /NXcollectioncolumn/extractor_current-field
extractor_voltage: /NXcollectioncolumn/extractor_voltage-field
fabrication: /NXfresnel_zone_plate/fabrication-field
faces: /NXoff_geometry/faces-field
facility_user_id: /NXarchive/entry/user/facility_user_id-field; /NXsnsevent/ENTRY/USER/facility_user_id-field; /NXsnshisto/ENTRY/USER/facility_user_id-field; /NXuser/facility_user_id-field
fast_axes: /NXelectronanalyser/fast_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction: /NXdetector_module/fast_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number: /NXuser/fax_number-field
features: /NXentry/features-field
fermi_chopper: /NXdirecttof/entry/INSTRUMENT/fermi_chopper-group; /NXinstrument/FERMI_CHOPPER-group; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
field_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view: /NXapm/ENTRY/atom_probe/field_of_view-field; /NXoptical_system_em/field_of_view-field
fieldname_errors: /NXdata/FIELDNAME_errors-field
figure_data: /NXgrating/figure_data-group; /NXmirror/figure_data-group
figure_of_merit: /NXspindispersion/figure_of_merit-field
file_name: /NXnote/file_name-field
filenames: /NXiqproc/ENTRY/reduction/input/filenames-field; /NXsqom/ENTRY/reduction/input/filenames-field
filter: /NXinstrument/FILTER-group
final_beam_divergence: /NXbeam/final_beam_divergence-field
final_energy: /NXbeam/final_energy-field
final_polarization: /NXbeam/final_polarization-field
final_polarization_stokes: /NXbeam/final_polarization_stokes-field
final_wavelength: /NXbeam/final_wavelength-field
final_wavelength_spread: /NXbeam/final_wavelength_spread-field
firmware: /NXellipsometry/ENTRY/INSTRUMENT/firmware-field
fit_function: /NXcalibration/fit_function-field
fixed_energy: /NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolution: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/fixed_revolution-field
fixed_slit: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/fixed_slit-field
flags: /NXreflections/flags-field
flatfield: /NXdetector/flatfield-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied: /NXdetector/flatfield_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error: /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors: /NXdetector/flatfield_errors-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path_length: /NXapm/ENTRY/atom_probe/flight_path_length-field
flip_current: /NXflipper/flip_current-field
flip_turns: /NXflipper/flip_turns-field
flipper: /NXinstrument/FLIPPER-group
fluorescence: /NXfluo/entry/INSTRUMENT/fluorescence-group
flux: /NXbeam/flux-field; /NXmx/ENTRY/INSTRUMENT/BEAM/flux-field; /NXsource/flux-field
flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time: /NXscanbox_em/flyback_time-field
focal_size: /NXcapillary/focal_size-field
focus_parameters: /NXfresnel_zone_plate/focus_parameters-field
focus_type: /NXxraylens/focus_type-field
focussing_probes: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-field
frame_average: /NXxpcs/entry/data/frame_average-field
frame_start_number: /NXdetector/frame_start_number-field; /NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum: /NXxpcs/entry/data/frame_sum-field
frame_time: /NXdetector/frame_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field; /NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency: /NXcollimator/frequency-field; /NXsnsevent/ENTRY/instrument/SNS/frequency-field; /NXsnshisto/ENTRY/instrument/SNS/frequency-field; /NXsource/frequency-field
frequency_log: /NXcollimator/frequency_log-group
g2: /NXxpcs/entry/data/g2-field
g2_derr: /NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func: /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials: /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func: /NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials: /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized: /NXxpcs/entry/data/G2_unnormalized-field
gain: /NXcapillary/gain-group
gain_setting: /NXdetector/gain_setting-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gap: /NXinsertion_device/gap-field
gas: /NXxraylens/gas-field
gas_pressure: /NXdetector/gas_pressure-field; /NXmpes/ENTRY/SAMPLE/gas_pressure-field; /NXxraylens/gas_pressure-field
geometry: /NXaperture/GEOMETRY-group; /NXbeam_stop/GEOMETRY-group; /NXbending_magnet/GEOMETRY-group; /NXcollimator/GEOMETRY-group; /NXcrystal/GEOMETRY-group; /NXcsg/geometry-field; /NXdetector/GEOMETRY-group; /NXdisk_chopper/GEOMETRY-group; /NXfermi_chopper/GEOMETRY-group; /NXfilter/GEOMETRY-group; /NXguide/GEOMETRY-group; /NXinsertion_device/GEOMETRY-group; /NXmirror/GEOMETRY-group; /NXmoderator/GEOMETRY-group; /NXmonitor/GEOMETRY-group; /NXmonochromator/geometry-group; /NXorientation/GEOMETRY-group; /NXsample/geometry-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group; /NXsastof/ENTRY/instrument/collimator/geometry-group; /NXsensor/geometry-group; /NXsource/geometry-group; /NXtranslation/geometry-group; /NXvelocity_selector/geometry-group
geometry_1: /NXcxi_ptycho/sample_1/geometry_1-group
getter_pump: /NXapm/ENTRY/atom_probe/getter_pump-group
grating: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING-group; /NXmonochromator/GRATING-group
grating_wavelength_max: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_max-field
grating_wavelength_min: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/GRATING/grating_wavelength_min-field
grid_type: /NXimage_set_em_kikuchi/grid_type-field
group_index: /NXdetector_group/group_index-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_names: /NXdetector_group/group_names-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent: /NXdetector_group/group_parent-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type: /NXdetector_group/group_type-field
guide: /NXinstrument/GUIDE-group
guide_current: /NXflipper/guide_current-field
guide_turns: /NXflipper/guide_turns-field
h: /NXreflections/h-field
harmonic: /NXinsertion_device/harmonic-field
heater_power: /NXmanipulator/heater_power-field
height: /NXfermi_chopper/height-field; /NXvelocity_selector/height-field
high_trip_value: /NXsensor/high_trip_value-field
hit_multiplicity: /NXapm/ENTRY/atom_probe/hit_multiplicity-group; /NXapm/ENTRY/atom_probe/hit_multiplicity/hit_multiplicity-field
hit_positions: /NXapm/ENTRY/atom_probe/ion_impact_positions/hit_positions-field
hit_rate: /NXimage_set_em_kikuchi/profiling/hit_rate-field
holder: /NXsnsevent/ENTRY/sample/holder-field; /NXsnshisto/ENTRY/sample/holder-field
hough_transformation: /NXimage_set_em_kikuchi/hough_transformation-group
i: /NXcanSAS/ENTRY/DATA/I-field
ibeam_column: /NXem/ENTRY/em_lab/IBEAM_COLUMN-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/IBEAM_COLUMN-group; /NXevent_data_em/IBEAM_COLUMN-group
ibeam_deflector: /NXem/ENTRY/em_lab/ibeam_deflector-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/ibeam_deflector-group; /NXevent_data_em/ibeam_deflector-group
id: /NXreflections/id-field
identifier: /NXmanufacturer/identifier-field; /NXsnsevent/ENTRY/sample/identifier-field; /NXsnshisto/ENTRY/sample/identifier-field
idev: /NXcanSAS/ENTRY/DATA/Idev-field
image_id: /NXimage_set_em_adf/DATA/image_id-field; /NXimage_set_em_kikuchi/DATA/image_id-field; /NXimage_set_em_se/DATA/image_id-field
image_key: /NXdetector/image_key-field; /NXtomo/entry/data/image_key-link; /NXtomo/entry/instrument/detector/image_key-field
image_set_em_adf: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ADF-group; /NXevent_data_em/IMAGE_SET_EM_ADF-group
image_set_em_bf: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BF-group; /NXevent_data_em/IMAGE_SET_EM_BF-group
image_set_em_bse: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_BSE-group; /NXevent_data_em/IMAGE_SET_EM_BSE-group
image_set_em_chamber: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_CHAMBER-group; /NXevent_data_em/IMAGE_SET_EM_CHAMBER-group
image_set_em_df: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DF-group; /NXevent_data_em/IMAGE_SET_EM_DF-group
image_set_em_diffrac: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_DIFFRAC-group; /NXevent_data_em/IMAGE_SET_EM_DIFFRAC-group
image_set_em_ecci: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_ECCI-group; /NXevent_data_em/IMAGE_SET_EM_ECCI-group
image_set_em_kikuchi: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_KIKUCHI-group; /NXevent_data_em/IMAGE_SET_EM_KIKUCHI-group
image_set_em_ronchigram: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_RONCHIGRAM-group; /NXevent_data_em/IMAGE_SET_EM_RONCHIGRAM-group
image_set_em_se: /NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET_EM_SE-group; /NXevent_data_em/IMAGE_SET_EM_SE-group
incident_angle: /NXguide/incident_angle-field; /NXmirror/incident_angle-field
incident_beam: /NXxpcs/entry/instrument/incident_beam-group
incident_beam_divergence: /NXbeam/incident_beam_divergence-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy: /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy: /NXbeam/incident_energy-field; /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy-field; /NXxpcs/entry/instrument/incident_beam/incident_energy-field
incident_energy_spread: /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field; /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field; /NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
incident_polarisation_stokes: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization: /NXbeam/incident_polarization-field; /NXmpes/ENTRY/INSTRUMENT/BEAM/incident_polarization-field
incident_polarization_stokes: /NXbeam/incident_polarization_stokes-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type: /NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
incident_wavelength: /NXbeam/incident_wavelength-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
incident_wavelength_spectrum: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread: /NXbeam/incident_wavelength_spread-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
incident_wavelength_weight: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights: /NXbeam/incident_wavelength_weights-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam: /NXxas/ENTRY/INSTRUMENT/incoming_beam-group
indexing: /NXimage_set_em_kikuchi/oim/indexing-group; /NXspectrum_set_em_xray/indexing-group
initial_radius: /NXapm/ENTRY/atom_probe/specimen_monitoring/initial_radius-field
input: /NXdetector/input-field; /NXiqproc/ENTRY/reduction/input-group; /NXsqom/ENTRY/reduction/input-group
insertion_device: /NXinstrument/INSERTION_DEVICE-group
instrument: /NXarchive/entry/instrument-group; /NXarpes/ENTRY/INSTRUMENT-group; /NXcanSAS/ENTRY/INSTRUMENT-group; /NXdirecttof/entry/INSTRUMENT-group; /NXellipsometry/ENTRY/INSTRUMENT-group; /NXentry/INSTRUMENT-group; /NXfluo/entry/INSTRUMENT-group; /NXindirecttof/entry/INSTRUMENT-group; /NXiqproc/ENTRY/instrument-group; /NXlauetof/entry/instrument-group; /NXmonopd/entry/INSTRUMENT-group; /NXmpes/ENTRY/INSTRUMENT-group; /NXmx/ENTRY/INSTRUMENT-group; /NXrefscan/entry/instrument-group; /NXreftof/entry/instrument-group; /NXsas/ENTRY/INSTRUMENT-group; /NXsastof/ENTRY/instrument-group; /NXscan/ENTRY/INSTRUMENT-group; /NXsnsevent/ENTRY/instrument-group; /NXsnshisto/ENTRY/instrument-group; /NXspe/ENTRY/INSTRUMENT-group; /NXsqom/ENTRY/instrument-group; /NXstxm/ENTRY/INSTRUMENT-group; /NXsubentry/INSTRUMENT-group; /NXtas/entry/INSTRUMENT-group; /NXtofnpd/entry/INSTRUMENT-group; /NXtofraw/entry/instrument-group; /NXtofsingle/entry/INSTRUMENT-group; /NXtomo/entry/instrument-group; /NXtomophase/entry/instrument-group; /NXtomoproc/entry/INSTRUMENT-group; /NXxas/ENTRY/INSTRUMENT-group; /NXxbase/entry/instrument-group; /NXxeuler/entry/instrument-group; /NXxkappa/entry/instrument-group; /NXxlaue/entry/instrument-group; /NXxlaueplate/entry/instrument-group; /NXxnb/entry/instrument-group; /NXxpcs/entry/instrument-group; /NXxrot/entry/instrument-group
instrument_1: /NXcxi_ptycho/entry_1/instrument_1-group
instrument_name: /NXapm/ENTRY/atom_probe/instrument_name-field; /NXem/ENTRY/em_lab/instrument_name-field
int_prf: /NXreflections/int_prf-field
int_prf_errors: /NXreflections/int_prf_errors-field
int_prf_var: /NXreflections/int_prf_var-field
int_sum: /NXreflections/int_sum-field
int_sum_errors: /NXreflections/int_sum_errors-field
int_sum_var: /NXreflections/int_sum_var-field
integral: /NXmonitor/integral-field; /NXmonopd/entry/MONITOR/integral-field; /NXreftof/entry/control/integral-field; /NXsas/ENTRY/MONITOR/integral-field; /NXtomophase/entry/control/integral-field; /NXxbase/entry/control/integral-field
integral_counts: /NXtofraw/entry/MONITOR/integral_counts-field
integral_log: /NXmonitor/integral_log-group
intensity: /NXimage_set_em_adf/DATA/intensity-field; /NXimage_set_em_kikuchi/DATA/intensity-field; /NXimage_set_em_se/DATA/intensity-field; /NXpeak/intensity-field
intensity_threshold: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/intensity_threshold-field
interior_atmosphere: /NXgrating/interior_atmosphere-field; /NXguide/interior_atmosphere-field; /NXmirror/interior_atmosphere-field
ion: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION-group; /NXspectrum_set_em_xray/indexing/PEAK/ION-group
ion_detector: /NXapm/ENTRY/atom_probe/ion_detector-group
ion_energy_profile: /NXibeam_column/ion_gun/ion_energy_profile-field
ion_filtering: /NXapm/ENTRY/atom_probe/ion_filtering-group
ion_gun: /NXibeam_column/ion_gun-group
ion_impact_positions: /NXapm/ENTRY/atom_probe/ion_impact_positions-group
ion_type: /NXion/ion_type-field
is_cylindrical: /NXcrystal/is_cylindrical-field
isotope_vector: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field; /NXion/isotope_vector-field
iupac_line_names: /NXspectrum_set_em_xray/indexing/PEAK/ION/iupac_line_names-field
k: /NXinsertion_device/k-field; /NXreflections/k-field
kappa: /NXxkappa/entry/name/kappa-link; /NXxkappa/entry/sample/kappa-field
ki_over_kf_scaling: /NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
l: /NXreflections/l-field
label: /NXpeak/label-field
lambda: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
laser_beam: /NXpulser_apm/laser_beam-group
laser_gun: /NXpulser_apm/laser_gun-group
last_fill: /NXsource/last_fill-field
last_process: /NXcalibration/last_process-field; /NXdistortion/last_process-field; /NXregistration/last_process-field
laue_group: /NXimage_set_em_kikuchi/oim/indexing/reflector/laue_group-field
layer_structure: /NXellipsometry/ENTRY/SAMPLE/layer_structure-field
layer_thickness: /NXgrating/layer_thickness-field; /NXmirror/layer_thickness-field
layout: /NXdetector/layout-field
length: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field; /NXinsertion_device/length-field; /NXvelocity_selector/length-field
lens_em: /NXcollectioncolumn/LENS_EM-group; /NXcorrector_cs/LENS_EM-group; /NXebeam_column/LENS_EM-group; /NXelectronanalyser/LENS_EM-group; /NXenergydispersion/LENS_EM-group; /NXibeam_column/LENS_EM-group; /NXspindispersion/LENS_EM-group
lens_geometry: /NXxraylens/lens_geometry-field
lens_length: /NXxraylens/lens_length-field
lens_material: /NXxraylens/lens_material-field
lens_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
lens_thickness: /NXxraylens/lens_thickness-field
light_source: /NXellipsometry/ENTRY/INSTRUMENT/light_source-group
line_time: /NXscanbox_em/line_time-field
load_lock_chamber: /NXapm/ENTRY/atom_probe/load_lock_chamber-group
local_electrode: /NXapm/ENTRY/atom_probe/local_electrode-group
local_name: /NXdetector/local_name-field
location: /NXapm/ENTRY/atom_probe/location-field; /NXem/ENTRY/em_lab/location-field
log: /NXsnsevent/ENTRY/DASlogs/LOG-group; /NXsnshisto/ENTRY/DASlogs/LOG-group
low_trip_value: /NXsensor/low_trip_value-field
lp: /NXreflections/lp-field
m_value: /NXfilter/m_value-field; /NXguide/m_value-field; /NXmirror/m_value-field
magnetic_field: /NXarchive/entry/sample/magnetic_field-field; /NXbending_magnet/magnetic_field-field; /NXsample/magnetic_field-field; /NXsample/magnetic_field-group
magnetic_field_env: /NXsample/magnetic_field_env-group
magnetic_field_log: /NXsample/magnetic_field_log-group
magnetic_wavelength: /NXinsertion_device/magnetic_wavelength-field
magnification: /NXcollectioncolumn/magnification-field; /NXoptical_system_em/magnification-field
manipulator: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR-group
manufacturer: /NXaperture_em/MANUFACTURER-group; /NXapm/ENTRY/atom_probe/MANUFACTURER-group; /NXcapillary/manufacturer-field; /NXchamber/MANUFACTURER-group; /NXcorrector_cs/MANUFACTURER-group; /NXebeam_column/MANUFACTURER-group; /NXebeam_column/electron_gun/MANUFACTURER-group; /NXem/ENTRY/em_lab/DETECTOR/MANUFACTURER-group; /NXem/ENTRY/em_lab/MANUFACTURER-group; /NXibeam_column/MANUFACTURER-group; /NXlens_em/MANUFACTURER-group; /NXpulser_apm/laser_gun/MANUFACTURER-group; /NXreflectron/MANUFACTURER-group; /NXstage_lab/MANUFACTURER-group
manufacturer_model: /NXdeflector/manufacturer_model-field
manufacturer_name: /NXapm/ENTRY/atom_probe/ion_detector/manufacturer_name-field; /NXdeflector/manufacturer_name-field; /NXlens_em/manufacturer_name-field
mask_material: /NXfresnel_zone_plate/mask_material-field
mask_thickness: /NXfresnel_zone_plate/mask_thickness-field
masks: /NXxpcs/entry/instrument/masks-group
mass: /NXsample/mass-field; /NXsample_component/mass-field
mass_spectrum: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
mass_to_charge_range: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field; /NXion/mass_to_charge_range-field
material: /NXaperture/material-field; /NXellipsometry/ENTRY/INSTRUMENT/window/material-field
max_gap: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT/max_gap-field
maximum_incident_angle: /NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion: /NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_value: /NXlog/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
mean_angular_deviation: /NXimage_set_em_kikuchi/oim/indexing/mean_angular_deviation-field
measured_data: /NXellipsometry/ENTRY/SAMPLE/measured_data-field
measurement: /NXem/ENTRY/measurement-group; /NXsensor/measurement-field
medium: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium-field
medium_refractive_indices: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/medium_refractive_indices-field
method: /NXem/ENTRY/SAMPLE/method-field
miller_indices: /NXimage_set_em_kikuchi/oim/indexing/reflector/miller_indices-field
min_bands: /NXimage_set_em_kikuchi/oim/indexing/min_bands-field
min_intensity: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/min_intensity-field
minimum_value: /NXlog/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror: /NXinstrument/MIRROR-group
mode: /NXcollectioncolumn/mode-field; /NXfluo/entry/MONITOR/mode-field; /NXimage_set_em_kikuchi/binning/mode-field; /NXimage_set_em_kikuchi/oim/band_detection/mode-field; /NXimage_set_em_kikuchi/oim/indexing/mode-field; /NXlauetof/entry/control/mode-field; /NXmonitor/mode-field; /NXmonopd/entry/MONITOR/mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/mode-field; /NXrefscan/entry/control/mode-field; /NXreftof/entry/control/mode-field; /NXsas/ENTRY/MONITOR/mode-field; /NXsastof/ENTRY/control/mode-field; /NXsnsevent/ENTRY/MONITOR/mode-field; /NXsnshisto/ENTRY/MONITOR/mode-field; /NXsource/mode-field; /NXtas/entry/MONITOR/mode-field; /NXtofnpd/entry/MONITOR/mode-field; /NXtofraw/entry/MONITOR/mode-field; /NXtofsingle/entry/MONITOR/mode-field; /NXxas/ENTRY/DATA/mode-field; /NXxas/ENTRY/MONITOR/mode-field; /NXxbase/entry/control/mode-field
model: /NXapm/ENTRY/atom_probe/ion_detector/model-field; /NXellipsometry/ENTRY/INSTRUMENT/model-field; /NXlens_em/model-field; /NXmanufacturer/model-field; /NXsensor/model-field
moderator: /NXinstrument/MODERATOR-group; /NXsnsevent/ENTRY/instrument/moderator-group; /NXsnshisto/ENTRY/instrument/moderator-group
module_offset: /NXdetector_module/module_offset-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
momentum_calibration: /NXmpes/ENTRY/PROCESS/momentum_calibration-group
momentum_resolution: /NXelectronanalyser/momentum_resolution-field
monitor: /NXapm/ENTRY/MONITOR-group; /NXcxi_ptycho/entry_1/instrument_1/MONITOR-group; /NXem/ENTRY/MONITOR-group; /NXentry/MONITOR-group; /NXfluo/entry/MONITOR-group; /NXmonopd/entry/MONITOR-group; /NXsas/ENTRY/MONITOR-group; /NXscan/ENTRY/MONITOR-group; /NXsnsevent/ENTRY/MONITOR-group; /NXsnshisto/ENTRY/MONITOR-group; /NXsubentry/MONITOR-group; /NXtas/entry/MONITOR-group; /NXtofnpd/entry/MONITOR-group; /NXtofraw/entry/MONITOR-group; /NXtofsingle/entry/MONITOR-group; /NXxas/ENTRY/MONITOR-group
monochromator: /NXarpes/ENTRY/INSTRUMENT/monochromator-group; /NXfluo/entry/INSTRUMENT/monochromator-group; /NXinstrument/MONOCHROMATOR-group; /NXrefscan/entry/instrument/monochromator-group; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group; /NXstxm/ENTRY/INSTRUMENT/monochromator-group; /NXtas/entry/INSTRUMENT/monochromator-group; /NXxas/ENTRY/INSTRUMENT/monochromator-group; /NXxbase/entry/instrument/monochromator-group
mosaic_horizontal: /NXcrystal/mosaic_horizontal-field
mosaic_vertical: /NXcrystal/mosaic_vertical-field
naive_point_cloud_density_map: /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map-group
name: /NXaperture_em/name-field; /NXapm/ENTRY/atom_probe/ion_detector/name-field; /NXapm/ENTRY/atom_probe/local_electrode/name-field; /NXapm/ENTRY/operator/name-field; /NXapm/ENTRY/specimen/name-field; /NXarchive/entry/instrument/SOURCE/name-field; /NXarchive/entry/instrument/name-field; /NXarchive/entry/sample/name-field; /NXarchive/entry/user/name-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field; /NXarpes/ENTRY/SAMPLE/name-field; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field; /NXcanSAS/ENTRY/PROCESS/name-field; /NXcanSAS/ENTRY/SAMPLE/name-field; /NXchamber/name-field; /NXcontainer/name-field; /NXcorrector_cs/name-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/name-field; /NXcxi_ptycho/sample_1/name-field; /NXdeflector/name-field; /NXebeam_column/electron_gun/name-field; /NXelectronanalyser/name-field; /NXellipsometry/ENTRY/operator/name-field; /NXem/ENTRY/SAMPLE/name-field; /NXem/ENTRY/operator/name-field; /NXenvironment/name-field; /NXfluo/entry/INSTRUMENT/SOURCE/name-field; /NXfluo/entry/SAMPLE/name-field; /NXibeam_column/ion_gun/name-field; /NXinstrument/name-field; /NXion/name-field; /NXiqproc/ENTRY/SAMPLE/name-field; /NXiqproc/ENTRY/instrument/SOURCE/name-field; /NXiqproc/ENTRY/instrument/name-field; /NXlauetof/entry/name-group; /NXlauetof/entry/sample/name-field; /NXlens_em/name-field; /NXmanipulator/name-field; /NXmanufacturer/name-field; /NXmonopd/entry/INSTRUMENT/SOURCE/name-field; /NXmonopd/entry/SAMPLE/name-field; /NXmpes/ENTRY/INSTRUMENT/SOURCE/name-field; /NXmpes/ENTRY/SAMPLE/name-field; /NXmx/ENTRY/INSTRUMENT/name-field; /NXmx/ENTRY/SAMPLE/name-field; /NXmx/ENTRY/SOURCE/name-field; /NXpositioner/name-field; /NXpulser_apm/laser_gun/name-field; /NXreflectron/name-field; /NXrefscan/entry/instrument/SOURCE/name-field; /NXrefscan/entry/sample/name-field; /NXreftof/entry/instrument/name-field; /NXreftof/entry/sample/name-field; /NXsample/name-field; /NXsample_component/name-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXsas/ENTRY/INSTRUMENT/name-field; /NXsas/ENTRY/SAMPLE/name-field; /NXsastof/ENTRY/instrument/name-field; /NXsastof/ENTRY/instrument/source/name-field; /NXsastof/ENTRY/sample/name-field; /NXsensor/name-field; /NXsnsevent/ENTRY/USER/name-field; /NXsnsevent/ENTRY/instrument/SNS/name-field; /NXsnsevent/ENTRY/instrument/name-field; /NXsnsevent/ENTRY/sample/name-field; /NXsnshisto/ENTRY/USER/name-field; /NXsnshisto/ENTRY/instrument/SNS/name-field; /NXsnshisto/ENTRY/instrument/name-field; /NXsnshisto/ENTRY/sample/name-field; /NXsource/name-field; /NXspe/ENTRY/INSTRUMENT/name-field; /NXspectrum_set_em_xray/indexing/composition_map/name-field; /NXsqom/ENTRY/SAMPLE/name-field; /NXsqom/ENTRY/instrument/SOURCE/name-field; /NXsqom/ENTRY/instrument/name-field; /NXstage_lab/name-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field; /NXtas/entry/INSTRUMENT/SOURCE/name-field; /NXtas/entry/SAMPLE/name-field; /NXtofnpd/entry/SAMPLE/name-field; /NXtofnpd/entry/user/name-field; /NXtofraw/entry/SAMPLE/name-field; /NXtofraw/entry/user/name-field; /NXtofsingle/entry/SAMPLE/name-field; /NXtofsingle/entry/user/name-field; /NXtomo/entry/instrument/SOURCE/name-field; /NXtomo/entry/sample/name-field; /NXtomophase/entry/instrument/SOURCE/name-field; /NXtomophase/entry/sample/name-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/name-field; /NXtomoproc/entry/SAMPLE/name-field; /NXuser/name-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXxas/ENTRY/SAMPLE/name-field; /NXxasproc/ENTRY/SAMPLE/name-field; /NXxbase/entry/instrument/source/name-field; /NXxbase/entry/sample/name-field; /NXxeuler/entry/name-group; /NXxkappa/entry/name-group; /NXxnb/entry/name-group; /NXxrot/entry/name-group
nature: /NXsnsevent/ENTRY/sample/nature-field; /NXsnshisto/ENTRY/sample/nature-field; /NXtofraw/entry/SAMPLE/nature-field; /NXtofsingle/entry/SAMPLE/nature-field
nominal: /NXmonitor/nominal-field
note: /NXaperture/NOTE-group; /NXcanSAS/ENTRY/PROCESS/NOTE-group; /NXenvironment/NOTE-group; /NXprocess/NOTE-group; /NXxpcs/entry/NOTE-group
notes: /NXentry/notes-group; /NXsnsevent/ENTRY/notes-field; /NXsnshisto/ENTRY/notes-field; /NXsource/notes-group; /NXsubentry/notes-group
num: /NXvelocity_selector/num-field
number: /NXfermi_chopper/number-field
number_of_bunches: /NXsource/number_of_bunches-field
number_of_cycles: /NXdetector/number_of_cycles-field
number_of_frames_averaged: /NXimage_set_em_se/number_of_frames_averaged-field
number_of_ion_types: /NXapm/ENTRY/atom_probe/ranging/number_of_ion_types-field
number_of_lenses: /NXxraylens/number_of_lenses-field
number_of_reflectors: /NXimage_set_em_kikuchi/oim/indexing/reflector/number_of_reflectors-field
number_of_runs: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/number_of_runs-field
number_sections: /NXguide/number_sections-field
nxspe_info: /NXspe/ENTRY/NXSPE_info-group
observed_frame: /NXreflections/observed_frame-field
observed_frame_errors: /NXreflections/observed_frame_errors-field
observed_frame_var: /NXreflections/observed_frame_var-field
observed_phi: /NXreflections/observed_phi-field
observed_phi_errors: /NXreflections/observed_phi_errors-field
observed_phi_var: /NXreflections/observed_phi_var-field
observed_px_x: /NXreflections/observed_px_x-field
observed_px_x_errors: /NXreflections/observed_px_x_errors-field
observed_px_x_var: /NXreflections/observed_px_x_var-field
observed_px_y: /NXreflections/observed_px_y-field
observed_px_y_errors: /NXreflections/observed_px_y_errors-field
observed_px_y_var: /NXreflections/observed_px_y_var-field
observed_x: /NXreflections/observed_x-field
observed_x_errors: /NXreflections/observed_x_errors-field
observed_x_var: /NXreflections/observed_x_var-field
observed_y: /NXreflections/observed_y-field
observed_y_errors: /NXreflections/observed_y_errors-field
observed_y_var: /NXreflections/observed_y_var-field
odd_layer_density: /NXmirror/odd_layer_density-field
odd_layer_material: /NXmirror/odd_layer_material-field
off_geometry: /NXbeam_stop/OFF_GEOMETRY-group; /NXbending_magnet/OFF_GEOMETRY-group; /NXcollimator/OFF_GEOMETRY-group; /NXcrystal/OFF_GEOMETRY-group; /NXdisk_chopper/OFF_GEOMETRY-group; /NXfermi_chopper/OFF_GEOMETRY-group; /NXfilter/OFF_GEOMETRY-group; /NXgrating/OFF_GEOMETRY-group; /NXguide/OFF_GEOMETRY-group; /NXinsertion_device/OFF_GEOMETRY-group; /NXmirror/OFF_GEOMETRY-group; /NXmoderator/OFF_GEOMETRY-group; /NXmonitor/OFF_GEOMETRY-group; /NXmonochromator/OFF_GEOMETRY-group; /NXsample/OFF_GEOMETRY-group; /NXsensor/OFF_GEOMETRY-group; /NXsolid_geometry/OFF_GEOMETRY-group; /NXsource/OFF_GEOMETRY-group; /NXvelocity_selector/OFF_GEOMETRY-group; /NXxraylens/OFF_GEOMETRY-group
offset: /NXcalibration/offset-field; /NXdata/offset-field
oim: /NXimage_set_em_kikuchi/oim-group
operation: /NXcsg/operation-field
operation_mode: /NXapm/ENTRY/operation_mode-field
operator: /NXapm/ENTRY/operator-group; /NXellipsometry/ENTRY/operator-group; /NXem/ENTRY/operator-group
optical_excitation: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation-group
optical_system_em: /NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/OPTICAL_SYSTEM_EM-group; /NXevent_data_em/OPTICAL_SYSTEM_EM-group; /NXimage_set_em_se/OPTICAL_SYSTEM_EM-group
orcid: /NXapm/ENTRY/operator/orcid-field; /NXellipsometry/ENTRY/operator/orcid-field; /NXem/ENTRY/operator/orcid-field; /NXuser/ORCID-field
order_no: /NXcrystal/order_no-field
orientation: /NXcontainer/orientation-group; /NXgeometry/ORIENTATION-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle: /NXellipsometry/ENTRY/INSTRUMENT/window/orientation_angle-field
orientation_matrix: /NXcrystal/orientation_matrix-field; /NXfilter/orientation_matrix-field; /NXlauetof/entry/sample/orientation_matrix-field; /NXsample/orientation_matrix-field; /NXsample_component/orientation_matrix-field; /NXtas/entry/SAMPLE/orientation_matrix-field; /NXxbase/entry/sample/orientation_matrix-field
origin: /NXsnsevent/ENTRY/instrument/APERTURE/origin-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin-group
original_axis: /NXcalibration/original_axis-field
original_centre: /NXdistortion/original_centre-field
original_points: /NXdistortion/original_points-field
other_detector: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/other_detector-field
other_material: /NXellipsometry/ENTRY/INSTRUMENT/window/other_material-field
outer_diameter: /NXfresnel_zone_plate/outer_diameter-field
outermost_zone_width: /NXfresnel_zone_plate/outermost_zone_width-field
output: /NXiqproc/ENTRY/reduction/output-group; /NXsqom/ENTRY/reduction/output-group
overlaps: /NXreflections/overlaps-field
packing_fraction: /NXcontainer/packing_fraction-field
pair_separation: /NXdisk_chopper/pair_separation-field
parameter: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/parameter-group; /NXapm/ENTRY/atom_probe/reconstruction/parameter-group
parameters: /NXentry/PARAMETERS-group; /NXquadric/parameters-field; /NXsubentry/PARAMETERS-group; /NXtomoproc/entry/reconstruction/parameters-group; /NXxasproc/ENTRY/XAS_data_reduction/parameters-group
parent: /NXregion/parent-field
parent_mask: /NXregion/parent_mask-field
partiality: /NXreflections/partiality-field
pass_energy: /NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field; /NXenergydispersion/pass_energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
path_length: /NXsample/path_length-field
path_length_window: /NXsample/path_length_window-field
pattern_center: /NXimage_set_em_kikuchi/oim/pattern_center-field
pattern_quality: /NXimage_set_em_kikuchi/oim/pattern_quality-field
peak: /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK-group; /NXspectrum_set_em_xray/indexing/PEAK-group
peak_identification: /NXapm/ENTRY/atom_probe/ranging/peak_identification-group
peak_model: /NXpeak/peak_model-field
peak_search_and_deconvolution: /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution-group
peaks: /NXspectrum_set_em_xray/indexing/composition_map/peaks-field
period: /NXgrating/period-field; /NXsource/period-field
phase: /NXdisk_chopper/phase-field; /NXinsertion_device/phase-field
phase_identifier: /NXimage_set_em_kikuchi/oim/indexing/phase_identifier-field; /NXimage_set_em_kikuchi/oim/indexing/reflector/phase_identifier-field
phase_name: /NXimage_set_em_kikuchi/oim/indexing/reflector/phase_name-field
phi: /NXxeuler/entry/name/phi-link; /NXxeuler/entry/sample/phi-field; /NXxkappa/entry/name/phi-link; /NXxkappa/entry/sample/phi-field
photon_energy: /NXspectrum_set_em_xray/DATA/photon_energy-field
pinhole_position: /NXpulser_apm/laser_beam/pinhole_position-group
pitch: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field; /NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id: /NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field; /NXsnshisto/ENTRY/DATA/pixel_id-link; /NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask: /NXdetector/pixel_mask-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied: /NXdetector/pixel_mask_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_time: /NXscanbox_em/pixel_time-field
plot: /NXellipsometry/ENTRY/plot-group
point_group: /NXsample/point_group-field; /NXsample_component/point_group-field
poison_depth: /NXmoderator/poison_depth-field
poison_material: /NXmoderator/poison_material-field
polar: /NXspe/ENTRY/data/polar-field
polar_angle: /NXcrystal/polar_angle-field; /NXdetector/polar_angle-field; /NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field; /NXlauetof/entry/instrument/detector/polar_angle-field; /NXmonopd/entry/DATA/polar_angle-link; /NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field; /NXreflections/polar_angle-field; /NXrefscan/entry/data/polar_angle-link; /NXrefscan/entry/instrument/DETECTOR/polar_angle-field; /NXreftof/entry/instrument/detector/polar_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXsastof/ENTRY/instrument/detector/polar_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field; /NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field; /NXtas/entry/INSTRUMENT/analyser/polar_angle-field; /NXtas/entry/SAMPLE/polar_angle-field; /NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field; /NXtofraw/entry/instrument/detector/polar_angle-field; /NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field; /NXxeuler/entry/instrument/detector/polar_angle-field; /NXxeuler/entry/name/polar_angle-link; /NXxkappa/entry/instrument/detector/polar_angle-field; /NXxkappa/entry/name/polar_angle-link; /NXxnb/entry/instrument/detector/polar_angle-field; /NXxnb/entry/name/polar_angle-link; /NXxrot/entry/instrument/detector/polar_angle-field
polar_width: /NXspe/ENTRY/data/polar_width-field
polarizer: /NXinstrument/POLARIZER-group; /NXsnsevent/ENTRY/instrument/POLARIZER-group; /NXsnshisto/ENTRY/instrument/POLARIZER-group
poles: /NXinsertion_device/poles-field
position: /NXenvironment/position-group; /NXpeak/position-field; /NXstage_lab/position-field
position_x: /NXxpcs/entry/sample/position_x-group
position_y: /NXxpcs/entry/sample/position_y-group
position_z: /NXxpcs/entry/sample/position_z-group
positioner: /NXinstrument/POSITIONER-group; /NXmanipulator/POSITIONER-group; /NXsample/POSITIONER-group; /NXsnsevent/ENTRY/DASlogs/POSITIONER-group; /NXsnshisto/ENTRY/DASlogs/POSITIONER-group; /NXstage_lab/POSITIONER-group
power: /NXinsertion_device/power-field; /NXpulser_apm/laser_gun/power-field; /NXsource/power-field
pre_sample_flightpath: /NXentry/pre_sample_flightpath-field; /NXsubentry/pre_sample_flightpath-field; /NXtofnpd/entry/pre_sample_flightpath-field; /NXtofraw/entry/pre_sample_flightpath-field; /NXtofsingle/entry/pre_sample_flightpath-field
predicted_frame: /NXreflections/predicted_frame-field
predicted_phi: /NXreflections/predicted_phi-field
predicted_px_x: /NXreflections/predicted_px_x-field
predicted_px_y: /NXreflections/predicted_px_y-field
predicted_x: /NXreflections/predicted_x-field
predicted_y: /NXreflections/predicted_y-field
preparation_date: /NXapm/ENTRY/specimen/preparation_date-field; /NXarchive/entry/sample/preparation_date-field; /NXellipsometry/ENTRY/SAMPLE/preparation_date-field; /NXem/ENTRY/SAMPLE/preparation_date-field; /NXmpes/ENTRY/SAMPLE/preparation_date-field; /NXsample/preparation_date-field
preparation_description: /NXmpes/ENTRY/SAMPLE/preparation_description-group
preset: /NXfluo/entry/MONITOR/preset-field; /NXlauetof/entry/control/preset-field; /NXmonitor/preset-field; /NXmonopd/entry/MONITOR/preset-field; /NXrefscan/entry/control/preset-field; /NXreftof/entry/control/preset-field; /NXsas/ENTRY/MONITOR/preset-field; /NXsastof/ENTRY/control/preset-field; /NXtas/entry/MONITOR/preset-field; /NXtofnpd/entry/MONITOR/preset-field; /NXtofraw/entry/MONITOR/preset-field; /NXtofsingle/entry/MONITOR/preset-field; /NXxas/ENTRY/MONITOR/preset-field; /NXxbase/entry/control/preset-field
pressure: /NXapm/ENTRY/atom_probe/control_software/analysis_chamber/pressure-field; /NXarchive/entry/sample/pressure-field; /NXsample/pressure-field
prf_cc: /NXreflections/prf_cc-field
probe: /NXarchive/entry/instrument/SOURCE/probe-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field; /NXebeam_column/electron_gun/probe-field; /NXfluo/entry/INSTRUMENT/SOURCE/probe-field; /NXibeam_column/ion_gun/probe-group; /NXiqproc/ENTRY/instrument/SOURCE/probe-field; /NXmonopd/entry/INSTRUMENT/SOURCE/probe-field; /NXmpes/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXrefscan/entry/instrument/SOURCE/probe-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXsastof/ENTRY/instrument/source/probe-field; /NXsnsevent/ENTRY/instrument/SNS/probe-field; /NXsnshisto/ENTRY/instrument/SNS/probe-field; /NXsource/probe-field; /NXsqom/ENTRY/instrument/SOURCE/probe-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXtas/entry/INSTRUMENT/SOURCE/probe-field; /NXtomo/entry/instrument/SOURCE/probe-field; /NXtomophase/entry/instrument/SOURCE/probe-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXxbase/entry/instrument/source/probe-field
process: /NXcanSAS/ENTRY/PROCESS-group; /NXentry/PROCESS-group; /NXimage_set_em_adf/PROCESS-group; /NXimage_set_em_bf/PROCESS-group; /NXimage_set_em_bse/PROCESS-group; /NXimage_set_em_chamber/PROCESS-group; /NXimage_set_em_df/PROCESS-group; /NXimage_set_em_diffrac/PROCESS-group; /NXimage_set_em_ecci/PROCESS-group; /NXimage_set_em_ronchigram/PROCESS-group; /NXinteraction_vol_em/PROCESS-group; /NXmpes/ENTRY/PROCESS-group; /NXspectrum_set_em_auger/PROCESS-group; /NXspectrum_set_em_cathodolum/PROCESS-group; /NXspectrum_set_em_eels/PROCESS-group; /NXsubentry/PROCESS-group; /NXxpcs/PROCESS-group
profile: /NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
profiling: /NXimage_set_em_kikuchi/profiling-group
program: /NXapm/ENTRY/atom_probe/hit_multiplicity/program-field; /NXapm/ENTRY/atom_probe/ion_filtering/program-field; /NXapm/ENTRY/atom_probe/ion_impact_positions/program-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/program-field; /NXapm/ENTRY/atom_probe/ranging/background_quantification/program-field; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/program-field; /NXapm/ENTRY/atom_probe/ranging/program-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/program-field; /NXapm/ENTRY/atom_probe/reconstruction/program-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/program-field; /NXapm/ENTRY/program-field; /NXarchive/entry/program-field; /NXellipsometry/ENTRY/acquisition_program/program-field; /NXem/ENTRY/program-field; /NXenvironment/program-field; /NXimage_set_em_adf/PROCESS/program-field; /NXiqproc/ENTRY/reduction/program-field; /NXprocess/program-field; /NXspectrum_set_em_xray/indexing/composition_map/program-field; /NXspectrum_set_em_xray/indexing/program-field; /NXsqom/ENTRY/reduction/program-field; /NXtomoproc/entry/reconstruction/program-field; /NXxasproc/ENTRY/XAS_data_reduction/program-field
program_name: /NXentry/program_name-field; /NXspe/ENTRY/program_name-field; /NXsubentry/program_name-field
projection: /NXcollectioncolumn/projection-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
protocol_name: /NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
proton_charge: /NXsnsevent/ENTRY/proton_charge-field; /NXsnshisto/ENTRY/proton_charge-field
psi: /NXspe/ENTRY/NXSPE_info/psi-field
pulse_energy: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/pulse_energy-field; /NXpulser_apm/laser_gun/pulse_energy-field
pulse_fraction: /NXapm/ENTRY/atom_probe/pulser/pulse_fraction-field; /NXpulser_apm/pulse_fraction-field
pulse_frequency: /NXapm/ENTRY/atom_probe/pulser/pulse_frequency-field; /NXpulser_apm/pulse_frequency-field
pulse_height: /NXevent_data/pulse_height-field
pulse_id: /NXapm/ENTRY/atom_probe/hit_multiplicity/pulse_id-field
pulse_mode: /NXapm/ENTRY/atom_probe/pulser/pulse_mode-field; /NXpulser_apm/pulse_mode-field
pulse_shape: /NXmoderator/pulse_shape-group; /NXsource/pulse_shape-group
pulse_time: /NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link; /NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_width: /NXsource/pulse_width-field
pulsed_voltage: /NXapm/ENTRY/atom_probe/pulser/pulsed_voltage-field; /NXpulser_apm/pulsed_voltage-field
pulser: /NXapm/ENTRY/atom_probe/pulser-group
pulses_since_last_ion: /NXapm/ENTRY/atom_probe/hit_multiplicity/pulses_since_last_ion-field
pump: /NXem/ENTRY/em_lab/PUMP-group
q: /NXcanSAS/ENTRY/DATA/Q-field
qdev: /NXcanSAS/ENTRY/DATA/Qdev-field
qh: /NXtas/entry/DATA/qh-link; /NXtas/entry/SAMPLE/qh-field
qk: /NXtas/entry/DATA/qk-link; /NXtas/entry/SAMPLE/qk-field
ql: /NXtas/entry/DATA/ql-link; /NXtas/entry/SAMPLE/ql-field
qmean: /NXcanSAS/ENTRY/DATA/Qmean-field
quadric: /NXsolid_geometry/QUADRIC-group
qx: /NXiqproc/ENTRY/DATA/qx-field; /NXsqom/ENTRY/DATA/qx-field
qy: /NXiqproc/ENTRY/DATA/qy-field; /NXsqom/ENTRY/DATA/qy-field
qz: /NXsqom/ENTRY/DATA/qz-field
r_slit: /NXfermi_chopper/r_slit-field
radiation: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radius: /NXdisk_chopper/radius-field; /NXfermi_chopper/radius-field; /NXvelocity_selector/radius-field
range: /NXmonitor/range-field
range_increment: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_increment-field
range_minmax: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_minmax-field
ranging: /NXapm/ENTRY/atom_probe/ranging-group
ratio: /NXdisk_chopper/ratio-field
raw: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field
raw_file: /NXtomoproc/entry/reconstruction/parameters/raw_file-field; /NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames: /NXsnsevent/ENTRY/raw_frames-field; /NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight: /NXdetector/raw_time_of_flight-field
raw_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/raw_tof-field
raw_value: /NXlog/raw_value-field; /NXpositioner/raw_value-field
rdeform_field: /NXdistortion/rdeform_field-field
read_bfield_current: /NXseparator/read_Bfield_current-group; /NXspin_rotator/read_Bfield_current-group
read_bfield_voltage: /NXseparator/read_Bfield_voltage-group; /NXspin_rotator/read_Bfield_voltage-group
read_current: /NXelectrostatic_kicker/read_current-group; /NXmagnetic_kicker/read_current-group; /NXquadrupole_magnet/read_current-group; /NXsolenoid_magnet/read_current-group
read_efield_current: /NXseparator/read_Efield_current-group; /NXspin_rotator/read_Efield_current-group
read_efield_voltage: /NXseparator/read_Efield_voltage-group; /NXspin_rotator/read_Efield_voltage-group
read_voltage: /NXelectrostatic_kicker/read_voltage-group; /NXmagnetic_kicker/read_voltage-group; /NXquadrupole_magnet/read_voltage-group; /NXsolenoid_magnet/read_voltage-group
real_time: /NXdetector/real_time-field
reconstructed_positions: /NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
reconstruction: /NXapm/ENTRY/atom_probe/reconstruction-group; /NXtomoproc/entry/reconstruction-group
reduction: /NXiqproc/ENTRY/reduction-group; /NXsqom/ENTRY/reduction-group
reference_data: /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data-group
reference_measurement: /NXcontainer/reference_measurement-link
reference_plane: /NXbeam/TRANSFORMATIONS/reference_plane-field
reference_sample: /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_sample-field
reference_wavelength: /NXellipsometry/ENTRY/INSTRUMENT/window/reference_data/reference_wavelength-field
reflection: /NXcrystal/reflection-field; /NXpolarizer/reflection-field
reflection_id: /NXreflections/reflection_id-field
reflectivity: /NXcrystal/reflectivity-group; /NXguide/reflectivity-group; /NXmirror/reflectivity-group
reflector: /NXimage_set_em_kikuchi/oim/indexing/reflector-group
reflectron: /NXapm/ENTRY/atom_probe/REFLECTRON-group
region_origin: /NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size: /NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
relative_molecular_mass: /NXcontainer/relative_molecular_mass-field; /NXsample/relative_molecular_mass-field; /NXsample_component/relative_molecular_mass-field
release_date: /NXarchive/entry/release_date-field
requested_pixel_time: /NXscanbox_em/requested_pixel_time-field
resolution: /NXimage_set_em_kikuchi/hough_transformation/resolution-field
revision: /NXarchive/entry/revision-field; /NXentry/revision-field; /NXsubentry/revision-field
revolution: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/revolution-field
roi: /NXimage_set_em_se/roi-field
role: /NXapm/ENTRY/operator/role-field; /NXarchive/entry/user/role-field; /NXem/ENTRY/operator/role-field; /NXsnsevent/ENTRY/USER/role-field; /NXsnshisto/ENTRY/USER/role-field; /NXuser/role-field
roll: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field; /NXcanSAS/ENTRY/SAMPLE/roll-field
rotating_element: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/rotating_element-field
rotation: /NXscanbox_em/rotation-field; /NXstage_lab/rotation-field
rotation_angle: /NXmonopd/entry/SAMPLE/rotation_angle-field; /NXrefscan/entry/data/rotation_angle-link; /NXrefscan/entry/sample/rotation_angle-field; /NXreftof/entry/sample/rotation_angle-field; /NXsample/rotation_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field; /NXsastof/ENTRY/instrument/detector/rotation_angle-field; /NXscan/ENTRY/DATA/rotation_angle-link; /NXscan/ENTRY/SAMPLE/rotation_angle-field; /NXspe/ENTRY/SAMPLE/rotation_angle-field; /NXstxm/ENTRY/SAMPLE/rotation_angle-field; /NXtas/entry/INSTRUMENT/analyser/rotation_angle-field; /NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field; /NXtas/entry/SAMPLE/rotation_angle-field; /NXtomo/entry/data/rotation_angle-link; /NXtomo/entry/sample/rotation_angle-field; /NXtomophase/entry/data/rotation_angle-link; /NXtomophase/entry/sample/rotation_angle-field; /NXxeuler/entry/name/rotation_angle-link; /NXxeuler/entry/sample/rotation_angle-field; /NXxkappa/entry/name/rotation_angle-link; /NXxkappa/entry/sample/rotation_angle-field; /NXxnb/entry/name/rotation_angle-link; /NXxnb/entry/sample/rotation_angle-field; /NXxrot/entry/name/rotation_angle-link; /NXxrot/entry/sample/rotation_angle-field
rotation_angle_step: /NXxrot/entry/sample/rotation_angle_step-field
rotation_speed: /NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field; /NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field; /NXdisk_chopper/rotation_speed-field; /NXfermi_chopper/rotation_speed-field; /NXvelocity_selector/rotation_speed-field
roughening_pump: /NXapm/ENTRY/atom_probe/roughening_pump-group
run: /NXcanSAS/ENTRY/run-field
run_control: /NXsensor/run_control-field
run_cycle: /NXarchive/entry/run_cycle-field; /NXentry/run_cycle-field; /NXsubentry/run_cycle-field
run_number: /NXapm/ENTRY/run_number-field; /NXsnsevent/ENTRY/run_number-field; /NXsnshisto/ENTRY/run_number-field; /NXtofraw/entry/run_number-field
sample: /NXarchive/entry/sample-group; /NXarpes/ENTRY/SAMPLE-group; /NXcanSAS/ENTRY/SAMPLE-group; /NXellipsometry/ENTRY/SAMPLE-group; /NXem/ENTRY/SAMPLE-group; /NXentry/SAMPLE-group; /NXfluo/entry/SAMPLE-group; /NXiqproc/ENTRY/SAMPLE-group; /NXlauetof/entry/sample-group; /NXmonopd/entry/SAMPLE-group; /NXmpes/ENTRY/SAMPLE-group; /NXmx/ENTRY/SAMPLE-group; /NXrefscan/entry/sample-group; /NXreftof/entry/sample-group; /NXsas/ENTRY/SAMPLE-group; /NXsastof/ENTRY/sample-group; /NXscan/ENTRY/SAMPLE-group; /NXsnsevent/ENTRY/sample-group; /NXsnshisto/ENTRY/sample-group; /NXspe/ENTRY/SAMPLE-group; /NXsqom/ENTRY/SAMPLE-group; /NXstxm/ENTRY/SAMPLE-group; /NXsubentry/SAMPLE-group; /NXtas/entry/SAMPLE-group; /NXtofnpd/entry/SAMPLE-group; /NXtofraw/entry/SAMPLE-group; /NXtofsingle/entry/SAMPLE-group; /NXtomo/entry/sample-group; /NXtomophase/entry/instrument/sample-group; /NXtomophase/entry/sample-group; /NXtomoproc/entry/SAMPLE-group; /NXxas/ENTRY/SAMPLE-group; /NXxasproc/ENTRY/SAMPLE-group; /NXxbase/entry/sample-group; /NXxeuler/entry/sample-group; /NXxkappa/entry/sample-group; /NXxnb/entry/sample-group; /NXxpcs/entry/sample-group; /NXxrot/entry/sample-group
sample_1: /NXcxi_ptycho/sample_1-group
sample_bias: /NXmanipulator/sample_bias-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/sample_bias-field
sample_component: /NXsample/SAMPLE_COMPONENT-group; /NXsample/sample_component-field
sample_history: /NXapm/ENTRY/specimen/sample_history-field; /NXellipsometry/ENTRY/SAMPLE/sample_history-field; /NXem/ENTRY/SAMPLE/sample_history-field; /NXmpes/ENTRY/SAMPLE/sample_history-group
sample_id: /NXarchive/entry/sample/sample_id-field
sample_name: /NXellipsometry/ENTRY/SAMPLE/sample_name-field
sample_orientation: /NXsample/sample_orientation-field; /NXsample_component/sample_orientation-field
sample_temperature: /NXmanipulator/sample_temperature-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/MANIPULATOR/sample_temperature-field
sample_x: /NXstxm/ENTRY/DATA/sample_x-field; /NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y: /NXstxm/ENTRY/DATA/sample_y-field; /NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z: /NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction: /NXmonitor/sampled_fraction-field
saturation_value: /NXdetector/saturation_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
scale: /NXregion/scale-field
scaling: /NXcalibration/scaling-field
scaling_factor: /NXdata/scaling_factor-field
scan_number: /NXxpcs/entry/scan_number-field
scan_rotation: /NXimage_set_em_se/scan_rotation-group
scattering_angle: /NXspindispersion/scattering_angle-field
scattering_cross_section: /NXattenuator/scattering_cross_section-field
scattering_energy: /NXspindispersion/scattering_energy-field
scattering_length_density: /NXsample/scattering_length_density-field; /NXsample_component/scattering_length_density-field
scattering_vector: /NXcrystal/scattering_vector-field
scheme: /NXcollectioncolumn/scheme-field; /NXenergydispersion/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
sdd: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
seblock: /NXspe/ENTRY/SAMPLE/seblock-field
segment_columns: /NXcrystal/segment_columns-field
segment_gap: /NXcrystal/segment_gap-field
segment_height: /NXcrystal/segment_height-field
segment_rows: /NXcrystal/segment_rows-field
segment_thickness: /NXcrystal/segment_thickness-field
segment_width: /NXcrystal/segment_width-field
semi_convergence_angle: /NXoptical_system_em/semi_convergence_angle-field
sensor: /NXebeam_column/SENSOR-group; /NXellipsometry/ENTRY/SAMPLE/environment_conditions/SENSOR-group; /NXenvironment/SENSOR-group; /NXibeam_column/SENSOR-group
sensor_material: /NXdetector/sensor_material-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_size: /NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
sensor_thickness: /NXdetector/sensor_thickness-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type: /NXfilter/sensor_type-group
sequence_index: /NXnote/sequence_index-field; /NXprocess/sequence_index-field
sequence_number: /NXdetector/sequence_number-field; /NXtomophase/entry/instrument/bright_field/sequence_number-field; /NXtomophase/entry/instrument/dark_field/sequence_number-field; /NXtomophase/entry/instrument/sample/sequence_number-field
serial_number: /NXapm/ENTRY/atom_probe/ion_detector/serial_number-field; /NXdetector/serial_number-field
set_bfield_current: /NXseparator/set_Bfield_current-field; /NXspin_rotator/set_Bfield_current-field
set_current: /NXelectrostatic_kicker/set_current-field; /NXmagnetic_kicker/set_current-field; /NXquadrupole_magnet/set_current-field; /NXsolenoid_magnet/set_current-field
set_efield_voltage: /NXseparator/set_Efield_voltage-field; /NXspin_rotator/set_Efield_voltage-field
set_voltage: /NXelectrostatic_kicker/set_voltage-field; /NXmagnetic_kicker/set_voltage-field
sgl: /NXtas/entry/SAMPLE/sgl-field
sgu: /NXtas/entry/SAMPLE/sgu-field
shadowfactor: /NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle: /NXapm/ENTRY/atom_probe/specimen_monitoring/shank_angle-field
shape: /NXattenuator/shape-group; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field; /NXcontainer/shape-group; /NXcrystal/shape-group; /NXgeometry/SHAPE-group; /NXgrating/shape-group; /NXmirror/shape-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape-group; /NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field; /NXshape/shape-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shermann_function: /NXspindispersion/shermann_function-field
short_name: /NXenvironment/short_name-field; /NXsensor/short_name-field
short_title: /NXapm/ENTRY/specimen/short_title-field; /NXem/ENTRY/SAMPLE/short_title-field; /NXsample/short_title-field
sigma_x: /NXsource/sigma_x-field
sigma_y: /NXsource/sigma_y-field
signal_amplitude: /NXapm/ENTRY/atom_probe/ion_detector/signal_amplitude-field
situation: /NXarchive/entry/sample/situation-field; /NXmpes/ENTRY/SAMPLE/situation-field; /NXsample/situation-field
size: /NXbeam_stop/size-field; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field; /NXshape/size-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
slit: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/SLIT-group; /NXfermi_chopper/slit-field
slit_angle: /NXdisk_chopper/slit_angle-field
slit_edges: /NXdisk_chopper/slit_edges-field
slit_height: /NXdisk_chopper/slit_height-field
slit_length: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits: /NXdisk_chopper/slits-field
slot: /NXdetector/slot-field
slow_axes: /NXelectronanalyser/slow_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
slow_pixel_direction: /NXdetector_module/slow_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
sns: /NXsnsevent/ENTRY/instrument/SNS-group; /NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id: /NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field; /NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name: /NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field; /NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool: /NXsnsevent/ENTRY/SNSHistoTool-group; /NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service: /NXsnsevent/ENTRY/instrument/SNStranslation_service-field; /NXsnshisto/ENTRY/instrument/SNStranslation_service-field
social_media_name: /NXapm/ENTRY/operator/social_media_name-field; /NXem/ENTRY/operator/social_media_name-field
social_media_platform: /NXapm/ENTRY/operator/social_media_platform-field; /NXem/ENTRY/operator/social_media_platform-field
soft_limit_max: /NXpositioner/soft_limit_max-field
soft_limit_min: /NXpositioner/soft_limit_min-field
solid_angle: /NXdetector/solid_angle-field
soller_angle: /NXcollimator/soller_angle-field
source: /NXarchive/entry/instrument/SOURCE-group; /NXarpes/ENTRY/INSTRUMENT/SOURCE-group; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group; /NXfluo/entry/INSTRUMENT/SOURCE-group; /NXinstrument/SOURCE-group; /NXiqproc/ENTRY/instrument/SOURCE-group; /NXmonopd/entry/INSTRUMENT/SOURCE-group; /NXmpes/ENTRY/INSTRUMENT/SOURCE-group; /NXmx/ENTRY/SOURCE-group; /NXrefscan/entry/instrument/SOURCE-group; /NXsas/ENTRY/INSTRUMENT/SOURCE-group; /NXsastof/ENTRY/instrument/source-group; /NXsqom/ENTRY/instrument/SOURCE-group; /NXstxm/ENTRY/INSTRUMENT/SOURCE-group; /NXtas/entry/INSTRUMENT/SOURCE-group; /NXtomo/entry/instrument/SOURCE-group; /NXtomophase/entry/instrument/SOURCE-group; /NXtomoproc/entry/INSTRUMENT/SOURCE-group; /NXxas/ENTRY/INSTRUMENT/SOURCE-group; /NXxbase/entry/instrument/source-group; /NXxlaue/entry/instrument/source-group
source_1: /NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x: /NXbending_magnet/source_distance_x-field
source_distance_y: /NXbending_magnet/source_distance_y-field
space_group: /NXcrystal/space_group-field; /NXimage_set_em_kikuchi/oim/indexing/reflector/space_group-field; /NXsample/space_group-field; /NXsample_component/space_group-field
spatial_calibration: /NXmpes/ENTRY/PROCESS/spatial_calibration-group
spatial_resolution: /NXelectronanalyser/spatial_resolution-field
specimen: /NXapm/ENTRY/specimen-group
specimen_monitoring: /NXapm/ENTRY/atom_probe/specimen_monitoring-group
spectral_resolution: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/spectral_resolution-field
spectrometer: /NXellipsometry/ENTRY/INSTRUMENT/spectrometer-group
spectrum: /NXbending_magnet/spectrum-group; /NXinsertion_device/spectrum-group
spectrum_set_em_auger: /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_AUGER-group; /NXevent_data_em/SPECTRUM_SET_EM_AUGER-group
spectrum_set_em_cathodolum: /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_CATHODOLUM-group; /NXevent_data_em/SPECTRUM_SET_EM_CATHODOLUM-group
spectrum_set_em_eels: /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_EELS-group; /NXevent_data_em/SPECTRUM_SET_EM_EELS-group
spectrum_set_em_xray: /NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET_EM_XRAY-group; /NXevent_data_em/SPECTRUM_SET_EM_XRAY-group
spindispersion: /NXelectronanalyser/SPINDISPERSION-group
spot_position: /NXpulser_apm/laser_beam/spot_position-group
spwidth: /NXvelocity_selector/spwidth-field
stage: /NXellipsometry/ENTRY/INSTRUMENT/stage-group
stage_lab: /NXapm/ENTRY/atom_probe/STAGE_LAB-group; /NXebeam_column/STAGE_LAB-group
stage_type: /NXellipsometry/ENTRY/INSTRUMENT/stage/stage_type-field
standing_voltage: /NXpulser_apm/standing_voltage-field
start: /NXregion/start-field
start_time: /NXapm/ENTRY/start_time-field; /NXarchive/entry/start_time-field; /NXarpes/ENTRY/start_time-field; /NXcxi_ptycho/entry_1/start_time-field; /NXdetector/start_time-field; /NXdirecttof/entry/start_time-field; /NXellipsometry/ENTRY/start_time-field; /NXem/ENTRY/measurement/EVENT_DATA_EM/start_time-field; /NXem/ENTRY/start_time-field; /NXentry/start_time-field; /NXevent_data_em/start_time-field; /NXfluo/entry/start_time-field; /NXindirecttof/entry/start_time-field; /NXmonitor/start_time-field; /NXmonopd/entry/start_time-field; /NXmpes/ENTRY/start_time-field; /NXmx/ENTRY/start_time-field; /NXrefscan/entry/start_time-field; /NXreftof/entry/start_time-field; /NXsas/ENTRY/start_time-field; /NXsastof/ENTRY/start_time-field; /NXscan/ENTRY/start_time-field; /NXsnsevent/ENTRY/start_time-field; /NXsnshisto/ENTRY/start_time-field; /NXstxm/ENTRY/start_time-field; /NXsubentry/start_time-field; /NXtas/entry/start_time-field; /NXtofnpd/entry/start_time-field; /NXtofraw/entry/start_time-field; /NXtofsingle/entry/start_time-field; /NXtomo/entry/start_time-field; /NXtomophase/entry/start_time-field; /NXxas/ENTRY/start_time-field; /NXxbase/entry/start_time-field; /NXxpcs/entry/start_time-field
static_q_list: /NXxpcs/entry/instrument/masks/static_q_list-field
static_roi_map: /NXxpcs/entry/instrument/masks/static_roi_map-field
statistics: /NXregion/statistics-group
status: /NXattenuator/status-field; /NXbeam_stop/status-field; /NXfilter/status-field; /NXimage_set_em_kikuchi/oim/indexing/status-field
step_size: /NXimage_set_em_kikuchi/step_size-field
stop_time: /NXdetector/stop_time-field
stress_field: /NXarchive/entry/sample/stress_field-field; /NXsample/stress_field-field
stride: /NXregion/stride-field
stxm_scan_type: /NXstxm/ENTRY/DATA/stxm_scan_type-field
subentry: /NXentry/SUBENTRY-group
substrate_density: /NXgrating/substrate_density-field; /NXmirror/substrate_density-field
substrate_material: /NXfilter/substrate_material-field; /NXgrating/substrate_material-field; /NXguide/substrate_material-field; /NXmirror/substrate_material-field
substrate_roughness: /NXfilter/substrate_roughness-field; /NXgrating/substrate_roughness-field; /NXguide/substrate_roughness-field; /NXmirror/substrate_roughness-field
substrate_thickness: /NXfilter/substrate_thickness-field; /NXgrating/substrate_thickness-field; /NXguide/substrate_thickness-field; /NXmirror/substrate_thickness-field
support_membrane_material: /NXfresnel_zone_plate/support_membrane_material-field
support_membrane_thickness: /NXfresnel_zone_plate/support_membrane_thickness-field
surface: /NXguide/reflectivity/surface-field
surface_type: /NXquadric/surface_type-field
symmetric: /NXxraylens/symmetric-field
symmetry: /NXdistortion/symmetry-field
t: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table: /NXvelocity_selector/table-field
taper: /NXinsertion_device/taper-field
target: /NXspindispersion/target-field
target_material: /NXsource/target_material-field
target_preparation: /NXspindispersion/target_preparation-field
target_preparation_date: /NXspindispersion/target_preparation_date-field
target_value: /NXpositioner/target_value-field
tdev: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
telephone_number: /NXapm/ENTRY/operator/telephone_number-field; /NXellipsometry/ENTRY/operator/telephone_number-field; /NXem/ENTRY/operator/telephone_number-field; /NXuser/telephone_number-field
temperature: /NXarchive/entry/sample/temperature-field; /NXarpes/ENTRY/SAMPLE/temperature-field; /NXcanSAS/ENTRY/SAMPLE/temperature-field; /NXcrystal/temperature-field; /NXfilter/temperature-field; /NXmoderator/temperature-field; /NXmpes/ENTRY/SAMPLE/temperature-field; /NXmx/ENTRY/SAMPLE/temperature-field; /NXsample/temperature-field; /NXsnsevent/ENTRY/instrument/moderator/temperature-field; /NXsnshisto/ENTRY/instrument/moderator/temperature-field; /NXspe/ENTRY/SAMPLE/temperature-field; /NXxbase/entry/sample/temperature-field; /NXxpcs/entry/sample/temperature-field
temperature_coefficient: /NXcrystal/temperature_coefficient-field
temperature_env: /NXsample/temperature_env-group
temperature_log: /NXcrystal/temperature_log-group; /NXfilter/temperature_log-group; /NXmoderator/temperature_log-group; /NXsample/temperature_log-group
temperature_set: /NXxpcs/entry/sample/temperature_set-field
term: /NXcanSAS/ENTRY/PROCESS/term-field; /NXparameters/term-field
thickness: /NXattenuator/thickness-field; /NXcanSAS/ENTRY/SAMPLE/thickness-field; /NXcrystal/thickness-field; /NXellipsometry/ENTRY/INSTRUMENT/window/thickness-field; /NXem/ENTRY/SAMPLE/thickness-field; /NXfilter/thickness-field; /NXflipper/thickness-field; /NXsample/thickness-field
threshold_energy: /NXdetector/threshold_energy-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
thumbnail: /NXapm/ENTRY/thumbnail-group; /NXem/ENTRY/thumbnail-group; /NXentry/thumbnail-group; /NXsubentry/thumbnail-group
tilt: /NXxnb/entry/name/tilt-link
tilt_1: /NXstage_lab/tilt_1-field
tilt_2: /NXstage_lab/tilt_2-field
tilt_angle: /NXxnb/entry/instrument/detector/tilt_angle-field
tilt_correction: /NXimage_set_em_se/tilt_correction-group
time: /NXlog/time-field; /NXsnsevent/ENTRY/DASlogs/LOG/time-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field; /NXsnshisto/ENTRY/DASlogs/LOG/time-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_of_flight: /NXdetector/time_of_flight-field; /NXlauetof/entry/control/time_of_flight-field; /NXlauetof/entry/instrument/detector/time_of_flight-field; /NXlauetof/entry/name/time_of_flight-link; /NXmonitor/time_of_flight-field; /NXreftof/entry/control/time_of_flight-field; /NXreftof/entry/data/time_of_flight-link; /NXreftof/entry/instrument/detector/time_of_flight-field; /NXsastof/ENTRY/control/time_of_flight-field; /NXsastof/ENTRY/data/time_of_flight-link; /NXsastof/ENTRY/instrument/detector/time_of_flight-field; /NXsnsevent/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/DATA/time_of_flight-link; /NXsnshisto/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field; /NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field; /NXtofnpd/entry/MONITOR/time_of_flight-field; /NXtofnpd/entry/data/time_of_flight-link; /NXtofraw/entry/MONITOR/time_of_flight-field; /NXtofraw/entry/data/time_of_flight-link; /NXtofraw/entry/instrument/detector/time_of_flight-field; /NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field; /NXtofsingle/entry/MONITOR/time_of_flight-field; /NXtofsingle/entry/data/time_of_flight-link
time_per_channel: /NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points: /NXellipsometry/ENTRY/SAMPLE/time_points-field
time_zone: /NXmx/ENTRY/INSTRUMENT/time_zone-field
timing: /NXelectrostatic_kicker/timing-field; /NXmagnetic_kicker/timing-field
title: /NXarchive/entry/title-field; /NXarpes/ENTRY/title-field; /NXcanSAS/ENTRY/title-field; /NXcxi_ptycho/entry_1/title-field; /NXdata/title-field; /NXdirecttof/entry/title-field; /NXentry/title-field; /NXfluo/entry/title-field; /NXindirecttof/entry/title-field; /NXiqproc/ENTRY/title-field; /NXmonopd/entry/title-field; /NXmpes/ENTRY/title-field; /NXmx/ENTRY/title-field; /NXrefscan/entry/title-field; /NXreftof/entry/title-field; /NXsas/ENTRY/title-field; /NXsastof/ENTRY/title-field; /NXscan/ENTRY/title-field; /NXsnsevent/ENTRY/title-field; /NXsnshisto/ENTRY/title-field; /NXsource/bunch_pattern/title-field; /NXsqom/ENTRY/title-field; /NXstxm/ENTRY/title-field; /NXsubentry/title-field; /NXtas/entry/title-field; /NXtofnpd/entry/title-field; /NXtofraw/entry/title-field; /NXtofsingle/entry/title-field; /NXtomo/entry/title-field; /NXtomophase/entry/title-field; /NXtomoproc/entry/title-field; /NXxas/ENTRY/title-field; /NXxasproc/ENTRY/title-field; /NXxbase/entry/title-field
tof_calibration: /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/tof_calibration-group
tof_distance: /NXenergydispersion/tof_distance-field
tolerance: /NXpositioner/tolerance-field
top_dead_center: /NXdisk_chopper/top_dead_center-field
top_up: /NXsource/top_up-field
total_counts: /NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnsevent/ENTRY/total_counts-field; /NXsnshisto/ENTRY/DATA/total_counts-link; /NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnshisto/ENTRY/total_counts-field
total_flux: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
total_flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
total_uncounted_counts: /NXsnsevent/ENTRY/total_uncounted_counts-field; /NXsnshisto/ENTRY/total_uncounted_counts-field
transformation: /NXdata/TRANSFORMATION-field
transformations: /NXaperture/TRANSFORMATIONS-group; /NXaperture_em/TRANSFORMATIONS-group; /NXattenuator/TRANSFORMATIONS-group; /NXbeam/TRANSFORMATIONS-group; /NXbeam_stop/TRANSFORMATIONS-group; /NXbending_magnet/TRANSFORMATIONS-group; /NXcapillary/TRANSFORMATIONS-group; /NXcollectioncolumn/TRANSFORMATIONS-group; /NXcollimator/TRANSFORMATIONS-group; /NXcoordinate_system_set/TRANSFORMATIONS-group; /NXcorrector_cs/TRANSFORMATIONS-group; /NXcrystal/TRANSFORMATIONS-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group; /NXcxi_ptycho/sample_1/transformations-group; /NXdeflector/TRANSFORMATIONS-group; /NXdetector/TRANSFORMATIONS-group; /NXdisk_chopper/TRANSFORMATIONS-group; /NXebeam_column/electron_gun/TRANSFORMATIONS-group; /NXelectronanalyser/TRANSFORMATIONS-group; /NXellipsometry/ENTRY/INSTRUMENT/stage/TRANSFORMATIONS-group; /NXenvironment/TRANSFORMATIONS-group; /NXfermi_chopper/TRANSFORMATIONS-group; /NXfilter/TRANSFORMATIONS-group; /NXflipper/TRANSFORMATIONS-group; /NXfresnel_zone_plate/TRANSFORMATIONS-group; /NXgrating/TRANSFORMATIONS-group; /NXguide/TRANSFORMATIONS-group; /NXibeam_column/ion_gun/TRANSFORMATIONS-group; /NXinsertion_device/TRANSFORMATIONS-group; /NXlens_em/TRANSFORMATIONS-group; /NXmanipulator/TRANSFORMATIONS-group; /NXmirror/TRANSFORMATIONS-group; /NXmoderator/TRANSFORMATIONS-group; /NXmonitor/TRANSFORMATIONS-group; /NXmonochromator/TRANSFORMATIONS-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group; /NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group; /NXpinhole/TRANSFORMATIONS-group; /NXpolarizer/TRANSFORMATIONS-group; /NXpositioner/TRANSFORMATIONS-group; /NXpulser_apm/laser_gun/TRANSFORMATIONS-group; /NXreflectron/TRANSFORMATIONS-group; /NXregistration/TRANSFORMATIONS-group; /NXsample/TRANSFORMATIONS-group; /NXsensor/TRANSFORMATIONS-group; /NXslit/TRANSFORMATIONS-group; /NXsource/TRANSFORMATIONS-group; /NXspindispersion/TRANSFORMATIONS-group; /NXstage_lab/TRANSFORMATIONS-group; /NXvelocity_selector/TRANSFORMATIONS-group; /NXxraylens/TRANSFORMATIONS-group
translation: /NXcxi_ptycho/data_1/translation-link; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field; /NXcxi_ptycho/sample_1/geometry_1/translation-link; /NXgeometry/TRANSLATION-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission: /NXcanSAS/ENTRY/SAMPLE/transmission-field; /NXcapillary/transmission-group; /NXcrystal/transmission-group; /NXfilter/transmission-group; /NXsample/transmission-group; /NXsample_component/transmission-group
transmission_spectrum: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmitting_material: /NXcollimator/transmitting_material-field; /NXfermi_chopper/transmitting_material-field
trigger_dead_time: /NXdetector/trigger_dead_time-field
trigger_delay_time: /NXdetector/trigger_delay_time-field
trigger_delay_time_set: /NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time: /NXdetector/trigger_internal_delay_time-field
turbomolecular_pump: /NXapm/ENTRY/atom_probe/turbomolecular_pump-group
twist: /NXvelocity_selector/twist-field
two_time_corr_func: /NXxpcs/entry/twotime/two_time_corr_func-field
twotime: /NXxpcs/entry/twotime-group
type: /NXapm/ENTRY/atom_probe/ion_detector/type-field; /NXarchive/entry/instrument/SOURCE/type-field; /NXarchive/entry/sample/type-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field; /NXattenuator/type-field; /NXcapillary/type-field; /NXcollimator/type-field; /NXcrystal/type-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/type-field; /NXdeflector/type-field; /NXdetector/type-field; /NXdisk_chopper/type-field; /NXenvironment/type-field; /NXfermi_chopper/type-field; /NXflipper/type-field; /NXfluo/entry/INSTRUMENT/SOURCE/type-field; /NXinsertion_device/type-field; /NXiqproc/ENTRY/instrument/SOURCE/type-field; /NXlens_em/type-field; /NXmanipulator/type-field; /NXmirror/type-field; /NXmoderator/type-field; /NXmonitor/type-field; /NXmonopd/entry/INSTRUMENT/SOURCE/type-field; /NXmpes/ENTRY/INSTRUMENT/SOURCE/type-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field; /NXnote/type-field; /NXpolarizer/type-field; /NXrefscan/entry/instrument/SOURCE/type-field; /NXsample/type-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXsastof/ENTRY/instrument/source/type-field; /NXsensor/type-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/type-field; /NXsnsevent/ENTRY/instrument/SNS/type-field; /NXsnsevent/ENTRY/instrument/moderator/type-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/type-field; /NXsnshisto/ENTRY/instrument/SNS/type-field; /NXsnshisto/ENTRY/instrument/moderator/type-field; /NXsource/type-field; /NXspindispersion/type-field; /NXsqom/ENTRY/instrument/SOURCE/type-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field; /NXtomo/entry/instrument/SOURCE/type-field; /NXtomophase/entry/instrument/SOURCE/type-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/type-field; /NXvelocity_selector/type-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXxbase/entry/instrument/source/type-field
ub_matrix: /NXsample/ub_matrix-field
underload_value: /NXdetector/underload_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell: /NXcrystal/unit_cell-field; /NXlauetof/entry/sample/unit_cell-field; /NXsample/unit_cell-field; /NXtas/entry/SAMPLE/unit_cell-field; /NXxbase/entry/sample/unit_cell-field
unit_cell_a: /NXcrystal/unit_cell_a-field; /NXfilter/unit_cell_a-field
unit_cell_abc: /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_abc-field; /NXsample/unit_cell_abc-field; /NXsample_component/unit_cell_abc-field
unit_cell_alpha: /NXcrystal/unit_cell_alpha-field; /NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma: /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_alphabetagamma-field; /NXsample/unit_cell_alphabetagamma-field; /NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b: /NXcrystal/unit_cell_b-field; /NXfilter/unit_cell_b-field
unit_cell_beta: /NXcrystal/unit_cell_beta-field; /NXfilter/unit_cell_beta-field
unit_cell_c: /NXcrystal/unit_cell_c-field; /NXfilter/unit_cell_c-field
unit_cell_class: /NXimage_set_em_kikuchi/oim/indexing/reflector/unit_cell_class-field; /NXsample/unit_cell_class-field; /NXsample_component/unit_cell_class-field
unit_cell_gamma: /NXcrystal/unit_cell_gamma-field; /NXfilter/unit_cell_gamma-field
unit_cell_volume: /NXcrystal/unit_cell_volume-field; /NXfilter/unit_cell_volume-field; /NXsample/unit_cell_volume-field; /NXsample_component/unit_cell_volume-field
url: /NXcite/url-field
usage: /NXcrystal/usage-field
user: /NXarchive/entry/user-group; /NXem/ENTRY/measurement/EVENT_DATA_EM/USER-group; /NXentry/USER-group; /NXevent_data_em/USER-group; /NXsnsevent/ENTRY/USER-group; /NXsnshisto/ENTRY/USER-group; /NXsubentry/USER-group; /NXtofnpd/entry/user-group; /NXtofraw/entry/user-group; /NXtofsingle/entry/user-group
value: /NXaperture_em/value-field; /NXelectrostatic_kicker/read_current/value-field; /NXelectrostatic_kicker/read_voltage/value-field; /NXlog/value-field; /NXmagnetic_kicker/read_current/value-field; /NXmagnetic_kicker/read_voltage/value-field; /NXorientation/value-field; /NXpositioner/value-field; /NXquadrupole_magnet/read_current/value-field; /NXquadrupole_magnet/read_voltage/value-field; /NXsensor/value-field; /NXseparator/read_Bfield_current/value-field; /NXseparator/read_Bfield_voltage/value-field; /NXseparator/read_Efield_current/value-field; /NXseparator/read_Efield_voltage/value-field; /NXsnsevent/ENTRY/DASlogs/LOG/value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsnshisto/ENTRY/DASlogs/LOG/value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsolenoid_magnet/read_current/value-field; /NXsolenoid_magnet/read_voltage/value-field; /NXspin_rotator/read_Bfield_current/value-field; /NXspin_rotator/read_Bfield_voltage/value-field; /NXspin_rotator/read_Efield_current/value-field; /NXspin_rotator/read_Efield_voltage/value-field
value_deriv1: /NXsensor/value_deriv1-field
value_deriv1_log: /NXsensor/value_deriv1_log-group
value_deriv2: /NXsensor/value_deriv2-field
value_deriv2_log: /NXsensor/value_deriv2_log-group
value_log: /NXsensor/value_log-group
variable: /NXiqproc/ENTRY/DATA/variable-field
variable_revolution: /NXellipsometry/ENTRY/INSTRUMENT/DETECTOR/variable_revolution-field
varied_parameters: /NXellipsometry/ENTRY/SAMPLE/environment_conditions/varied_parameters-field
vector: /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity: /NXpositioner/velocity-field
velocity_selector: /NXinstrument/VELOCITY_SELECTOR-group; /NXmonochromator/VELOCITY_SELECTOR-group
version: /NXellipsometry/ENTRY/acquisition_program/version-field; /NXiqproc/ENTRY/reduction/version-field; /NXprocess/version-field; /NXsnsevent/ENTRY/SNSHistoTool/version-field; /NXsnshisto/ENTRY/SNSHistoTool/version-field; /NXsqom/ENTRY/reduction/version-field; /NXtomoproc/entry/reconstruction/version-field; /NXxasproc/ENTRY/XAS_data_reduction/version-field
vertices: /NXcylindrical_geometry/vertices-field; /NXoff_geometry/vertices-field
virtual_pixel_interpolation_applied: /NXdetector/virtual_pixel_interpolation_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
voltage: /NXdeflector/voltage-field; /NXebeam_column/electron_gun/voltage-field; /NXibeam_column/ion_gun/voltage-field; /NXlens_em/voltage-field; /NXsource/voltage-field
voltage_and_bowl_correction: /NXapm/ENTRY/atom_probe/voltage_and_bowl_correction-group
volume_fraction: /NXsample/volume_fraction-field; /NXsample_component/volume_fraction-field
wavelength: /NXcrystal/wavelength-field; /NXdetector/efficiency/wavelength-field; /NXellipsometry/ENTRY/INSTRUMENT/spectrometer/wavelength-field; /NXellipsometry/ENTRY/SAMPLE/environment_conditions/optical_excitation/wavelength-field; /NXfermi_chopper/wavelength-field; /NXfluo/entry/INSTRUMENT/monochromator/wavelength-field; /NXguide/reflectivity/wavelength-field; /NXmonochromator/wavelength-field; /NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field; /NXpulser_apm/laser_gun/wavelength-field; /NXrefscan/entry/instrument/monochromator/wavelength-field; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field; /NXvelocity_selector/wavelength-field; /NXxbase/entry/instrument/monochromator/wavelength-field; /NXxlaue/entry/instrument/source/distribution/wavelength-field
wavelength_error: /NXmonochromator/wavelength_error-field
wavelength_errors: /NXmonochromator/wavelength_errors-field
wavelength_max: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
wavelength_min: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
wavelength_range: /NXdisk_chopper/wavelength_range-field
wavelength_spread: /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field; /NXvelocity_selector/wavelength_spread-field
width: /NXfermi_chopper/width-field; /NXvelocity_selector/width-field
winding_order: /NXoff_geometry/winding_order-field
window: /NXellipsometry/ENTRY/INSTRUMENT/window-group
working_distance: /NXcapillary/working_distance-field; /NXcollectioncolumn/working_distance-field; /NXoptical_system_em/working_distance-field
x: /NXbeam_stop/x-field; /NXcxi_ptycho/DATA/x-link; /NXdata/x-field; /NXtomoproc/entry/data/x-field
x_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field; /NXslit/x_gap-field
x_indices: /NXcxi_ptycho/DATA/x_indices-field
x_pixel_offset: /NXdetector/x_pixel_offset-field; /NXsnsevent/ENTRY/DATA/x_pixel_offset-link; /NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field; /NXsnshisto/ENTRY/DATA/x_pixel_offset-link; /NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field; /NXdetector/x_pixel_size-field; /NXlauetof/entry/instrument/detector/x_pixel_size-field; /NXreftof/entry/instrument/detector/x_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXsastof/ENTRY/instrument/detector/x_pixel_size-field; /NXtomo/entry/instrument/detector/x_pixel_size-field; /NXtomophase/entry/instrument/sample/x_pixel_size-field; /NXxbase/entry/instrument/detector/x_pixel_size-field; /NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
x_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field; /NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position: /NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
x_translation: /NXsample/x_translation-field; /NXtomo/entry/sample/x_translation-field; /NXtomophase/entry/sample/x_translation-field; /NXxbase/entry/sample/x_translation-field
xas_data_reduction: /NXxasproc/ENTRY/XAS_data_reduction-group
xpos: /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/xpos-field; /NXimage_set_em_adf/DATA/xpos-field; /NXimage_set_em_kikuchi/DATA/xpos-field; /NXimage_set_em_se/DATA/xpos-field; /NXspectrum_set_em_xray/DATA/xpos-field; /NXspectrum_set_em_xray/indexing/composition_map/DATA/xpos-field
xraylens: /NXinstrument/XRAYLENS-group
y: /NXbeam_stop/y-field; /NXcxi_ptycho/DATA/y-link; /NXdata/y-field; /NXtomoproc/entry/data/y-field
y_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field; /NXslit/y_gap-field
y_indices: /NXcxi_ptycho/DATA/y_indices-field
y_pixel_offset: /NXdetector/y_pixel_offset-field; /NXsnsevent/ENTRY/DATA/y_pixel_offset-link; /NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field; /NXsnshisto/ENTRY/DATA/y_pixel_offset-link; /NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field; /NXdetector/y_pixel_size-field; /NXlauetof/entry/instrument/detector/y_pixel_size-field; /NXreftof/entry/instrument/detector/y_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXsastof/ENTRY/instrument/detector/y_pixel_size-field; /NXtomo/entry/instrument/detector/y_pixel_size-field; /NXtomophase/entry/instrument/sample/y_pixel_size-field; /NXxbase/entry/instrument/detector/y_pixel_size-field; /NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
y_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field; /NXcanSAS/ENTRY/SAMPLE/y_position-field
y_rotation_axis_pixel_position: /NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
y_translation: /NXtomo/entry/sample/y_translation-field; /NXtomophase/entry/sample/y_translation-field; /NXxbase/entry/sample/y_translation-field
yaw: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field; /NXcanSAS/ENTRY/SAMPLE/yaw-field
ypos: /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/ypos-field; /NXimage_set_em_adf/DATA/ypos-field; /NXimage_set_em_kikuchi/DATA/ypos-field; /NXimage_set_em_se/DATA/ypos-field; /NXspectrum_set_em_xray/DATA/ypos-field; /NXspectrum_set_em_xray/indexing/composition_map/DATA/ypos-field
z: /NXdata/z-field; /NXtomoproc/entry/data/z-field
z_pixel_offset: /NXdetector/z_pixel_offset-field
z_translation: /NXtomo/entry/sample/z_translation-field; /NXtomophase/entry/sample/z_translation-field
zone_height: /NXfresnel_zone_plate/zone_height-field
zone_material: /NXfresnel_zone_plate/zone_material-field
zone_support_material: /NXfresnel_zone_plate/zone_support_material-field
zpos: /NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/zpos-field

written: 2023-11-21T10:30:34.942834